<p><strong>Our Library never stops expanding. What are the most recent contributions to LabRulezICPMS Library in the week of 22nd June 2026? Check out new documents from the field of spectroscopy/spectrometry and related techniques!</strong></p><blockquote><p><span style="font-size:20px;">👉 </span><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library"><span style="font-size:20px;"><strong>SEARCH THE LARGEST REPOSITORY OF DOCUMENTS ABOUT SPECTROSCOPY/SPECTROMETRY RELATED TECHNIQUES</strong></span></a></p></blockquote><blockquote><p><strong>👉 Need info about different analytical techniques?</strong> Peek into <a target="_blank" rel="noopener noreferrer" href="https://lcms.labrulez.com/library"><strong>LabRulezLCMS</strong></a> or <a target="_blank" rel="noopener noreferrer" href="https://gcms.labrulez.com/library"><strong>LabRulezGCMS</strong></a> libraries.</p></blockquote><p>This week we bring you technical note by <strong>Agilent Technologies</strong>, application note by <strong>Shimadzu </strong>and other document by <strong>Thermo Fisher Scientific!</strong></p><h3><strong>1. Agilent Technologies: Dual-Cell System (DCS) and Advanced Helium Mode (AHM)</strong></h3><p><strong>Technological developments for higher sensitivity and better interference removal than traditional He-KED</strong></p><ul><li>Technical note</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/te_batch_conversion_tool_9500_icp_ms_5994_9214en_agilent_0a1bba76e2.pdf"><strong>Full PDF for download</strong></a></li></ul><h4><strong>Evolution of Agilent’s Collision Reaction Cell (CRC) technology&nbsp;</strong></h4><ul><li><strong>2001: </strong>Launched the first ICP-MS with CRC—the Agilent 7500c with Octopole Reaction System (ORS)&nbsp;</li><li><strong>2011:</strong> Introduced High Energy Helium Mode (HEHe) using Collision Induced Dissociation (CID)&nbsp;</li><li><strong>2012: </strong>Released the world’s first Triple Quadrupole ICP-MS—the Agilent 8800 ICP-QQQ&nbsp;</li><li><strong>2016:</strong> Launched the second generation Triple Quadrupole ICP-MS with Axial Acceleration—the Agilent 8900 ICP-QQQ&nbsp;</li><li><strong>2026: </strong>Introduced the innovative Dual-Cell System (DCS) and Advanced Helium Mode (AHM) for the Agilent 9500 ICP-QQQ</li></ul><p>Collision/Reaction Cell (CRC) technology is now a standard feature in modern ICP-MS systems, providing a reliable means of eliminating spectral interferences that compromise data quality. ICP-MS systems with integrated CRCs range from single quadrupole (SQ) ICP-MS used in environmental and food analysis, to triple quadrupole ICP-MS (ICP-QQQ) for advanced research applications. For routine applications, Helium Kinetic Energy Discrimination (He KED) mode, commonly referred to as helium mode (He mode), is the most widely used CRC operational mode. The widespread use of He mode is due to its universal effectiveness in reducing a broad range of polyatomic interferences without the need for element-specific optimization.&nbsp;</p><p>Unlike CRCs that rely on reactive cell gases and require complex tuning (often referred to as reaction cells), He mode effectively mitigates many commonly occurring polyatomic ion interferences without the need for intricate adjustments. In contrast, reaction cells often require careful selection of gas type (such as ammonia or oxygen) and tuning parameters based on the specific interfering ions on analytes of interest.&nbsp;</p><p>Building on the simplicity of He mode, Agilent has developed Advanced Helium Mode (AHM) for the <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=10&amp;search=9500"><strong>Agilent 9500 Triple Quadrupole ICP-MS (ICP-QQQ)</strong></a>. AHM represents a breakthrough in interference removal technology, enabled by the newly designed Agilent Dual-Cell System (DCS) and high-speed cell voltage control. These innovations deliver high sensitivity across the mass range and superior interference removal performance for routine applications. Compared to conventional He mode, AHM demonstrates the following improvements:</p><ul><li>Around a 20-fold sensitivity improvement for low-mass elements, such as beryllium (Be) and boron (B)&nbsp;</li><li>Around a 2-fold improvement for mid-to-high mass elements&nbsp;</li><li>A reduction of more than 33% in data acquisition time while maintaining detection limits (DLs), accelerating analytical measurement times&nbsp;</li></ul><p>AHM not only replaces traditional He KED but also consolidates multiple tuning modes including no gas, He, and HEHe into a single, streamlined mode. Integrated into the 9500 ICP-QQQ, AHM is a next-generation standard He mode that is faster, simpler, and delivers higher performance than its predecessor. This technical note describes the performance enhancement mechanisms of the DCS and AHM. It also includes some comparative results with conventional He KED mode to highlight the analytical improvements of AHM.</p><h4><strong>Overview and advantages of AHM&nbsp;</strong></h4><p>Typically, multi-element ICP-MS methods apply no gas mode to the determination of low-mass elements like Be and B due to low sensitivity in traditional He KED mode. Consequently, many routine ICP-MS applications have required multiple tune setups, combining no gas, He, and HEHe. Each mode switch introduces a delay due to cell pressure stabilization requirements.&nbsp;</p><p>In practice, low-mass elements (m/z &lt; 23) are generally unaffected by polyatomic ion interferences, so KED is often unnecessary. Therefore, in AHM, different voltages are applied to the DCS (effectively disabling KED) for low-mass elements, while keeping standard settings for elements with m/z ≥ 23.&nbsp;</p><p>The DCS voltages are dynamically switched in sync with Q2 using a high-speed voltage control circuit, providing over 20× sensitivity improvement for low-mass elements compared to conventional He mode. AHM eliminates the need to run in no gas mode, greatly simplifying the method. As a default approach, AHM alone is suitable for most applications.<sup>1</sup></p><h3><strong>2. Shimadzu: Damping Force Characteristic Test of Suspension Struts [JASO C611]</strong></h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/an_01_01017_en_2fbbb9c247.pdf"><strong>Full PDF for download</strong></a></li></ul><h5><strong>User Benefits</strong></h5><ul><li>Damping force characteristic tests on suspension struts can be performed based on the JASO C611 standard.&nbsp;</li><li>Combination test enables automatic speed change and measurement.&nbsp;</li><li>High responsiveness of the EMT series enables testing at high excitation speed.</li></ul><p>Various components play an important role in achieving a comfortable ride in vehicles. Among them, the suspension strut used in the suspension system is an important component that stabilizes the vehicle body by mitigating the impact caused by uneven road surfaces.&nbsp;</p><p>“JASO C611 Suspension Struts for Automobiles”1), a standard of JASO (Japanese Automotive Standards Organization), established by JSAE, specifies the definition, quality, and test method for suspension struts. There is no international standard that is equivalent to JASO C611.&nbsp;</p><p>In order to improve the performance of suspension struts, it is necessary to measure the damping force against speed by changing the excitation speed. The performance of suspension struts can be confirmed by measuring the response, such as the relationship between speed and damping force and the Lissajous waveform.&nbsp;</p><p>This article introduces an example of the test method “Damping Force Characteristic Test” specified in JASO C611, which was conducted on a Shimadzu EMT series electromagnetic fatigue testing machine.</p><h4><strong>Testing Equipment&nbsp;</strong></h4><p>The EMT-1kNV-50 electromagnetic dynamic and fatigue testing machine was used in this test. Fig. 1 shows a photograph of the testing machine. The electromagnetic actuator with extremely high frequency response enables highly accurate dynamic testing. In this test, the maximum test speed was 0.6 m/s. The EMT seriesis most suitable for testing at such high frequencies.</p><h4><strong>Conclusion&nbsp;</strong></h4><p>A damping force characteristic test on a suspension strut based on JASO C611 was conducted using an EMT series electromagnetic fatigue testing machine and Windows software for 4830. The test conditions were set using the excitation speed, and it was confirmed that the test was accurately controlled as set. The standard “JASO C611 Suspension Struts for Automobiles” referred to this time is derived from “JASO C602 Automotive Parts - Telescopic Shock Absorbers for Suspension Systems”2). Although C602 also prescribes a damping force characteristic test, it is almost equivalent to the C611, and the test machine configuration can be used by replacing the jig.</p><h3><strong>3. Thermo Fisher Scientific: </strong><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products/2206"><strong>Hypulse Surface Analysis System</strong></a></h3><ul><li>Other document</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/Hypulse_DS_0516_EN_05_2025_1998238_WEB_0e44628a5e.pdf"><strong>Full PDF for download</strong></a></li></ul><h4><strong>Key features&nbsp;</strong></h4><ul><li><strong>Unique depth profiling capability</strong>. The femtosecond laser ablation system provides controlled material removal without inducing chemical damage to your sample.&nbsp;</li><li><strong>Fast, efficient XPS</strong>. Quick sample pump-down times, a unique sample viewing system, and high sensitivity for all analysis areas help ensure exceptional data quality, even for highly challenging samples.&nbsp;</li><li><strong>Co-incident additional spectroscopy</strong>. Optimize the information obtained from features of interest with the addition of optional analytical techniques, including ion scattering spectroscopy, reflected electron energy loss spectroscopy, and UV photoelectron spectroscopy.&nbsp;</li><li><strong>Fully featured software. </strong>The latest version of the Avantage Data System is included for data collection and analysis, with the ability to import data into Thermo Scientific Maps Software for correlation with electron microscopy images.</li></ul><h4><strong>Technical highlights&nbsp;</strong></h4><h5><strong>Micro-focused, monochromated aluminum K-alpha X-ray source&nbsp;</strong></h5><ul><li>Computer-controlled quartz-crystal monochromator&nbsp;</li><li>Software-adjustable spot size&nbsp;</li><li>Spot size range: 10–400 μm&nbsp;</li><li>Motorized, water-cooled anode with 16 positions&nbsp;</li></ul><h5><strong>Electron optics and analyzer</strong></h5><ul><li>Electrostatic objective lens&nbsp;</li><li>Full 180° hemispherical μ-metal shielded analyzer&nbsp;</li><li>Continuously selectable pass energy: 1–400 eV&nbsp;</li><li>128-channel, signature-corrected, positionsensitive detector&nbsp;</li><li>Automatic energy scale and transmission function calibration&nbsp;</li></ul><h5><strong>Charge compensation system&nbsp;</strong></h5><ul><li>Patented dual-beam electron and ion source&nbsp;</li><li>Beam energy for charge compensation: 0–5 eV&nbsp;</li></ul><h5><strong>Femtosecond-laser ablation system&nbsp;</strong></h5><ul><li>Fully integrated 1,030 nm pulsed femtosecond-laser source&nbsp;</li><li>Class 1 laser system&nbsp;</li><li>Tunable pulse energy up to 1 mJ&nbsp;</li><li>Computer-controlled attenuation optimizes ablation conditions&nbsp;</li><li>Beam imaging module for system calibration and alignment</li></ul>

News from LabRulezICPMS Library - Week 26, 2026

Electron spectroscopy for chemical analysis of liquids

<p><strong>In the week from June 29, the following webinars await you in the field of atomic and molecular spectroscopy and spectrometry</strong></p><blockquote><h4><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinars"><strong>👉 DETAILS AND REGISTRATION IN THE WEBINARS SECTION</strong></a></h4><p><strong>👉 Search and filter in the largest global database</strong> with over <strong>5 500 GC, LC, MS and spectroscopy webinars</strong>.</p></blockquote><h5><strong>1. Metrohm: Simplifying Through-Container Testing with Raman Spectroscopy in the Pharmaceutical Industry</strong></h5><ul><li>Mo, 29.6.2026 15:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6308">Registration</a></li></ul><p>In this webinar, we will demonstrate a more robust and practical alternative to SORS for see-through Raman analysis.</p><h5><strong>2. SelectScience: End-to-end PAT: Connecting advanced analytics and data across the bioprocess lifecycle</strong></h5><ul><li>Mo, 29.6.2026 16:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6307">Registration</a></li></ul><p>Learn how integrated PAT strategies combining NMR, Raman, IR, and digital workflows enable continuous process understanding, smoother tech transfer, and QbD from development to GMP manufacturing.</p><h5><strong>3. Bruker: Bruker Fluorescence Microscopy Solutions: Automated Imaging and Light-Sheet Microscopy</strong></h5><ul><li>Tu, 30.6.2026 17:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6309">Registration</a></li></ul><p>Discover Bruker’s integrated imaging ecosystem combining light-sheet microscopy, high-content screening, and high-performance data management for scalable, high-quality biological imaging workflows.</p><h5><strong>4. Agilent Technologies: Measuring Diverse Samples with UV/VIS Spectrometers and Integrating Spheres</strong></h5><ul><li>Tu, 30.6.2026 20:30 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6052">Registration</a></li></ul><p>This webinar will discuss diffuse transmission and reflection UV/VIS measurements, including how to perform measurements with Agilent’s Cary 60 UV/VIS Spectrometer.</p><h5><strong>5. Milestone: Unlock Smarter Digestion: AI and the Smart Features that Transform Your Daily Routine</strong></h5><ul><li>We, 1.7.2026 16:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6312">Registration</a></li></ul><p>Learn how Milestone’s intelligent digestion technologies, including MAIA AI Agent, easyTEMP, and SRC, help reduce downtime, simplify workflows, and improve laboratory productivity.</p><h5><strong>6. Bruker: High-Energy XRD - Diffraction Without Limits</strong></h5><ul><li>Th, 2.7.2026 10:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6314">Registration</a></li></ul><p>Join us to explore how high-energy XRD with the D8 ADVANCE HE and D8 DISCOVER HE enables the study of materials under realistic conditions.</p><h5><strong>7. Agilent Technologies: Spectral Flow Cytometry Masterclass - Session 1</strong></h5><ul><li>Fr, 3.7.2026 07:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6316">Registration</a></li></ul><p>Learn how full-spectrum flow cytometry enables high-dimensional cell analysis. Explore spectral flow technology, experimental design, and applications in immunology, oncology, and vaccine research.</p>

Webinars LabRulezICPMS Week 27/2026

Article

Webinars

Application

Scientific article

Science and research

Everything from the world of analytical chemistry in one place. We connect people in solving their problems. At Labrulez you will find all the necessary information easily, quickly and clearly. Stop searching and start finding.

LabRulez

Bruker

Shimadzu Corporation

<p><strong>In this webinar, our panel of experts will discuss the market for alcohol-based hand sanitizers, the current regulatory environment, as well as analytical solutions including gas chromatography, Fourier-transform infrared spectroscopy, and UV-Vis spectroscopy to ensure the purity, potency, and safety of alcohols and hand sanitizers.</strong></p>
<blockquote>
<p><strong>Presenter:</strong> Nicole Zhang (Senior Product Specialist, Shimadzu Asia Pacific)</p>
</blockquote>
<blockquote>
<p>Nicole studies in UK in Microbiology and Immunology, prior joining Shimadzu, she worked in different companies in analytical instrument industry for more than 10 years, from Chemist to marketing and in charge of different technologies from LC, MS to Spectro products. She joined Shimadzu at the year of 2018 as spectroscopy product specialist and in charge of food quality and safety market.</p>
</blockquote>
<blockquote>
<p><strong>Presenter:</strong> Jackie (Product Specialist (GC &amp; GCMS), Shimadzu Asia Pacific)</p>
</blockquote>
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<p>After graduating from the National University of Singapore, Jackie has garnered over 6 years of research, training and facilitation experience. Jackie meets scientists from various industries to share technical knowledge and collect feedback, understanding their problems and helping them find well-suited solutions in GC-related analyses.</p>
</blockquote>


Shimadzu: Stay Safe! Comprehensive Analysis of Alcohols and Hand Sanitizers

Stay Safe! Comprehensive Analysis of Alcohols and Hand Sanitizers

The market for alcohol-based hand sanitizers, the current regulatory environment, as well as analytical solutions including gas chromatography.

Comprehensive Analysis of Alcohols and Hand Sanitizers

<p>Simple good practices for quality data including:</p>
<ul>
<li><p><strong>Sample prep and key accessories</strong></p>
</li>
<li><p><strong>Attenuated Reflectance Accessory (ATR)</strong></p>
<ul>
<li><p>Overview</p>
</li>
<li><p>Pros and Cons</p>
</li>
<li><p>Tips for ATR analysis</p>
</li>
</ul>
</li>
<li><p><strong>Environmental effects - CO2 and H2O</strong></p>
</li>
<li><p><strong>Library search and precautions</strong></p>
</li>
<li><p><strong>Micro analysis</strong></p>
<ul>
<li>Application examples</li>
</ul>
</li>
</ul>


FTIR Tips and Tricks Webinar

<p><strong>The interest in complete microplastics solutions is tremendous, but many analytical labs shun the initial investment in time, money and labor to establish a well-running standard procedure.</strong></p><p><strong>In this webinar, our microplastic application specialist Dr. Marten Seeba will show you:</strong></p><ul><li>Demands and requirements to establish a microplastic lab based on FT-IR technology</li><li>Necessary steps in sample preparation from various sources</li><li>Theoretical basics to understand the idea behind FT-IR analysis of microparticles</li><li>That there are wholesome, complete solutions to microplastic analysis, right out of the box</li></ul><div><div><div><div><div><p><strong>You will learn about:</strong></p><ul><li>Instrumental setup and experimentals</li><li>Particle analysis and evaluation</li><li>Microplastic software solutions</li></ul><p><strong>We will cover the basics of:</strong></p><ul><li>Sample types</li><li>Sample preparation steps</li><li>FT-IR experimental procedures</li><li>FT-IR instrumentation</li></ul></div></div></div></div></div><div><div><div><div><div><p><strong>Who should attend:</strong></p><ul><li>Analytical service laboratories</li><li>Environmental researchers</li><li>Food &amp; Feed producers</li><li>Drinks &amp; Beverages producers</li></ul><blockquote><p><strong>Presenter: </strong>Dr. Marten Seeba</p><p>Dr. Marten Seeba graduated in chemistry from the University of Göttingen before joining Bruker as an application expert for FT-IR and IR laser microscopy. He is a point of contact for our customers and as such has gained a great deal of expertise in many applications such as microplastics, pharmaceuticals, tissue analysis and materials science.</p></blockquote></div></div></div></div></div>

Bruker: Getting your lab ready for microplastic analysis by FT-IR spectroscopy

Getting your lab ready for microplastic analysis by FT-IR spectroscopy

Learn how to set up an FT-IR microplastic lab, including key requirements, sample preparation steps, analysis principles, and ready-to-use solution options.

Preparing Your Lab for Microplastic Analysis via FT-IR

<p><strong>LUMOS II ushers in a new era in FT-IR Microscopy.</strong></p><blockquote><p><strong>Presenter: &nbsp;</strong>Dr. Tom Tague (Applications Manager and Chair of the Safety Committee Bruker Corporation)</p><div><p>Dr. Tom Tague is the Applications Manager (FTIR and Raman products) and Chair of the Safety Committee for Bruker Corporation. He is also a member of the Visiting Advisory Committee of the Metropolitan Museum of Art in New York and the Advisory Board of Amplified Sciences. Dr. Tague received his Ph.D. from the University of Utah in Physical Chemistry and his B.S. in Chemistry, from the University of Texas at San Antonio. He conducted his postdoctoral research at the University of Virginia working with professor Lester Andrews. He is a member of the American Chemical Society, the Society for Applied Spectroscopy, the American Physical Society, and the Optical Society of America. Dr. Tague is active in developing new methods and instrumentation with the goal of improving the sensitivity and detection limits of spectroscopy related applications. Dr. Tague has more than 80 publications and 5 patents.</p></div></blockquote>

Bruker: The State-of-the-Art in Infrared Microscopy

The State-of-the-Art in Infrared Microscopy

LUMOS II ushers in a new era in FT-IR Microscopy.

<p><strong>In an emission experimental setup, the sample itself acts as light source of the spectrometer and may emit light in various scenarios, e.g.: thermal emission, photoluminescence or the characterization of self-made lasers and other emission devices. Therefore, emission spectroscopy is established in versatile application fields in academia as well as in industrial applied research &amp; development or failure analysis.</strong></p><p>Bruker provides innovative instrumental solutions for emission spectroscopy with a broad palette of research spectrometers, dedicated measurement modules and accessories. In a series of customer webinars, we will explain the basic principles and give application examples as well as practical handling hints for emission spectroscopy.</p><div><div><div><div><blockquote><h5><strong>Part 1: General Setup of Emission Experiments and Determination of Emissivity.</strong></h5><p><a data-g-name="CallToAction" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1595203200000,&quot;onWebinar&quot;:true,&quot;external&quot;:true}" data-protectable="" rel="noopener" target="_blank"><a target="_blank" rel="noopener noreferrer" href="https://register.gotowebinar.com/recording/6908255056900555277"><strong>Watch Recording of Part 1&nbsp;</strong></a></a></p></blockquote><div><blockquote><h5><strong>Part 2: Photoluminescence (PL) Experiments: Challenges and the Suitable Instrumental Solutions.</strong></h5><p><a data-g-name="CallToAction" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1595203200000,&quot;onWebinar&quot;:true,&quot;external&quot;:true}" data-protectable="" rel="noopener" target="_blank"><a target="_blank" rel="noopener noreferrer" href="https://register.gotowebinar.com/recording/216857088501568015"><strong>Watch Recording of Part 2&nbsp;</strong></a></a></p></blockquote><div><blockquote><h5><strong>Part 3: Step Scan as a Powerful Tool for Emission Experiments and Source Characterization.</strong></h5><p><a data-g-name="CallToAction" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1595203200000,&quot;onWebinar&quot;:true,&quot;external&quot;:true}" data-protectable="" rel="noopener" target="_blank"><a target="_blank" rel="noopener noreferrer" href="https://register.gotowebinar.com/recording/6306834291730245889">W<strong>atch Recording of Part 3&nbsp;</strong></a></a></p></blockquote></div></div></div></div></div></div>

FTIR Emission Spectroscopy

We will explain the basic principles and give application examples as well as practical handling hints for emission spectroscopy.

<div><p><strong>This webinar introduces scattering scanning nearfield optical microscopy (s-SNOM), which provides&nbsp;information about the complex optical properties of the nanoscale region of a sample under a metallized tip that nanofocuses optical radiation. Recent developments in novel methods, advanced light sources, and refined instrumentation have made s-SNOM more valuable and accessible.</strong></p><p>Capabilities for s-SNOM are available on Bruker’s <a target="_blank" rel="noopener noreferrer" href="https://www.bruker.com/en/products-and-solutions/infrared-and-raman/nanoscale-infrared-spectrometers/anasys-nanoir3-s.html">nanoIR3-s</a> and <a target="_blank" rel="noopener noreferrer" href="https://www.bruker.com/en/products-and-solutions/infrared-and-raman/nanoscale-infrared-spectrometers/anasys-nanoir3-s-broadband.html">nanoIR3-s Broadband</a> platforms, and the technique itself was developed in collaboration with the webinar’s guest speaker, Professor Markus Raschke, Dept. of Physics/JILA, University of Colorado.</p><p>After a thorough and illustrative introduction to the method, Prof. Raschke presents his research efforts towards using s-SNOM, this new dimension in optical nanoprobe imaging, to access the functional properties of materials and systems including electronic materials, energy materials, nano-biomaterials, quantum systems, and more.</p><p>Following Prof. Raschke’s comprehensive presentation, he answers questions from the audience covering topics from the maximum sensitivity level of s-SNOM to the use of complementary AFM techniques with s-SNOM.&nbsp;</p></div>

Bruker: Recent Advancements in Infrared Nano-imaging with Nano-FTIR Spectroscopy

Recent Advancements in Infrared Nano-imaging with Nano-FTIR Spectroscopy

Learn how s-SNOM advances understanding of the functional properties of materials

Advances in Infrared Nano-imaging with Nano-FTIR

<div><div><div><p><strong>Due to the systematic shrinking of the size of devices in the semiconductor industry, characterizing nanoscale surface contaminations in interconnects and circuitries has become a pivotal issue in test and failure analysis. Continuous development in process technology/engineering has led to the fabrication of semiconductor devices with sub-µm feature resolution, which in turn demands high-resolution analytical tools for proper characterization.&nbsp;</strong></p><p>Nanoscale AFM-IR spectroscopy is a non-destructive chemical analysis method that takes advantage of the nanoscale capabilities of AFM and outputs easy-to-understand, FTIR-like spectra. As described by the presenters, the advantages of nanoscale AFM-IR can be leveraged in the semiconductor industry in many ways, like for chemical characterization of organic contaminants, nano-patterned metal/low-k dielectrics, and directed self-assembly of block copolymers.</p></div></div></div><div><div><blockquote><ul><li><a data-g-name="CallToAction" data-protectable="" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1587340800000,&quot;onWebinar&quot;:true,&quot;external&quot;:false}" target="_self"><a target="_blank" rel="noopener noreferrer" href="https://www.bruker.com/en/news-and-events/webinars/2020/two-complementary-nanoscale-ir-techniques-photothermal-afm-ir-and-s-snom.html"><strong>watch part 1: Two Complementary Nanoscale IR Techniques: Photothermal AFM-IR and s-SNOM&nbsp;</strong></a></a></li><li><a data-g-name="CallToAction" data-protectable="" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1587340800000,&quot;onWebinar&quot;:true,&quot;external&quot;:false}" target="_self"><a target="_blank" rel="noopener noreferrer" href="https://www.bruker.com/en/news-and-events/webinars/2020/online-demo-of-the-nanoir3-system-photothermal-afm-ir.html"><strong>watch part 2: Online Demo of the nanoIR3 System - Photothermal AFM-IR&nbsp;</strong></a></a></li><li><a data-g-name="CallToAction" data-protectable="" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1587340800000,&quot;onWebinar&quot;:true,&quot;external&quot;:false}" target="_self"><a target="_blank" rel="noopener noreferrer" href="https://www.bruker.com/en/news-and-events/webinars/2020/chemical-characterization-of-heterogenous-polymeric-materials-on-the-nanoscale-using-photothermal-afm-ir.html"><strong>watch part 3: Chemical Characterization of Heterogenous Polymeric Materials on the Nanoscale Using Photothermal AFM-IR&nbsp;</strong></a></a></li><li><a data-g-name="CallToAction" data-protectable="" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1587340800000,&quot;onWebinar&quot;:true,&quot;external&quot;:false}" target="_self"><a target="_blank" rel="noopener noreferrer" href="https://www.bruker.com/en/news-and-events/webinars/2020/2d-material-characterization-using-photothermal-afm-ir-and-s-snom.html"><strong>watch part 5: 2D Material Characterization Using Photothermal AFM-IR and s-SNOM&nbsp;</strong></a></a></li></ul></blockquote></div></div>

Bruker: Nanoscale AFM-IR Spectroscopy and Imaging for Failure Analysis of Electronic Devices

Nanoscale AFM-IR Spectroscopy and Imaging for Failure Analysis of Electronic Devices

Characterizing nanometer-scale features in semiconductor devices using nanoIR spectroscopy

Nanoscale AFM-IR for Failure Analysis of Electronics

<div><p><span style="letter-spacing:0.0px;"><strong>This webinar will show you the analysis of two standard samples in failure analysis and troubleshooting with the LUMOS II.&nbsp;</strong></span></p><p>Our application specialist Eric Klein skips lengthy PowerPoint presentations and welcomes you directly to our demo lab for a hands-on instrument session. After 20 minutes of analyzing typical samples, Eric will answer your questions about using µ-FT-IR in your daily QC and failure analysis for at least 30 minutes.</p><p><strong>About the samples:</strong></p><ul><li>The first sample is a typical customer complaint which was returned due to an unknown contaminant on the products surface.</li><li>The second sample is is a product contamination found during quality control. It is analyzed to understand the contamination route and prevent recurrence.</li></ul><p><strong>Content of webinar:</strong></p><ul><li>Measurement two typical µ-FT-IR samples</li><li>Detection and identification of unknown contaminants</li><li>Q&amp;A session on failure analysis by FT-IR</li></ul><p><strong>What you'll learn:</strong></p><ul><li>How to FT-IR microscopy is used to analyze contaminations.</li><li>How to apply the LUMOS II FT-IR microscope</li><li>How to evaluate using OPUS software</li></ul><blockquote><p><strong>Presenter: </strong>Eric Klein&nbsp;</p><p>Eric Klein has been with Bruker for 10 years and started out as an application scientist. During this time, he has acquired a great deal of expertise in infrared microscopy and, as a product manager, played a leading role in the development of LUMOS II. The session will be moderated.</p></blockquote></div>

Bruker: About Failure Analysis, Customer Complaints and Troubleshooting

About Failure Analysis, Customer Complaints and Troubleshooting

This webinar will show you the analysis of two standard samples in failure analysis and troubleshooting with the LUMOS II. 

Failure Analysis, Complaints & Troubleshooting Insights

<div><p><strong>Photothermal AFM-IR can provide nanoscale chemical information with highly resolved IR spectra, that directly correlate to FTIR transmission spectroscopy. This webinar covers numerous AFM-IR applications in the field of life sciences, illustrating broad applicability for samples from tissue to single protein fibrils. The speaker also discusses issues, challenges, and potentials of correlative measurements.</strong></p><p><strong>Some of the samples and applications presented include:</strong></p><ul><li>Lipids bodies stored in microorganisms</li><li>Abnormal accumulations in kidney biopsy</li><li>Penetration of nanocarriers in tissue or model cell lines</li><li>Protein nano-assemblies structures</li></ul><p><strong>The speaker discusses the new experimental approaches developed to solve problems encountered during these studies, and the efforts to overcome technical constraints imposed by the system itself, such as:</strong></p><ul><li>Configuration of illumination</li><li>Sensitivity</li><li>Soft-sample damage</li></ul></div>

Bruker: Photothermal AFM-IR Spectroscopy and Imaging for Life Science

Photothermal AFM-IR Spectroscopy and Imaging for Life Science

This webinar explores AFM-IR applications in life sciences, showing its wide use from tissue samples to single protein fibrils.

Photothermal AFM-IR for Life Science Spectroscopy & Imaging

<div><p><strong>During this webinar, the speaker considers how photothermal AFM-IR can benefit the polymer characterization applications of:</strong></p><ul><li>Multilayer films</li><li>Polymer blends/block copolymers</li><li>Organic photovoltaics</li></ul><div><div><div><p>This webinar covers numerous academia and industry applications in the field of polymer characterization. To illustrate the broad applicability, select examples are discussed in detail, ranging from phase separation in polymer blends/block copolymers and reverse engineering in multilayer films to fibers and thin film characterization. This webinar shows how photothermal AFM-IR provides nanoscale chemical information with highly resolved IR spectra that directly correlate to FT-IR transmission spectroscopy.</p></div></div></div><div><div><blockquote><ul><li><a data-g-name="CallToAction" data-protectable="" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1586649600000,&quot;onWebinar&quot;:true,&quot;external&quot;:false}" target="_self"><a target="_blank" rel="noopener noreferrer" href="https://www.bruker.com/en/news-and-events/webinars/2020/two-complementary-nanoscale-ir-techniques-photothermal-afm-ir-and-s-snom.html"><strong>watch part 1: Two Complementary Nanoscale IR Techniques: Photothermal AFM-IR and s-SNOM&nbsp;</strong></a></a></li><li><a data-g-name="CallToAction" data-protectable="" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1586649600000,&quot;onWebinar&quot;:true,&quot;external&quot;:false}" target="_self"><a target="_blank" rel="noopener noreferrer" href="https://www.bruker.com/en/news-and-events/webinars/2020/online-demo-of-the-nanoir3-system-photothermal-afm-ir.html"><strong>watch part 2: Online Demo of the nanoIR3 System - Photothermal AFM-IR&nbsp;</strong></a></a></li><li><a data-g-name="CallToAction" data-protectable="" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1586649600000,&quot;onWebinar&quot;:true,&quot;external&quot;:false}" target="_self"><a target="_blank" rel="noopener noreferrer" href="https://www.bruker.com/en/news-and-events/webinars/2020/nanoscale-afm-ir-spectroscopy-and-imaging-for-failure-analysis-of-electronic-devices.html"><strong>watch part 4: Nanoscale AFM-IR Spectroscopy and Imaging for Failure Analysis of Electronic Devices&nbsp;</strong></a></a></li><li><a data-g-name="CallToAction" data-protectable="" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1586649600000,&quot;onWebinar&quot;:true,&quot;external&quot;:false}" target="_self"><a target="_blank" rel="noopener noreferrer" href="https://www.bruker.com/en/news-and-events/webinars/2020/2d-material-characterization-using-photothermal-afm-ir-and-s-snom.html"><strong>watch part 5: 2D Material Characterization Using Photothermal AFM-IR and s-SNOM&nbsp;</strong></a></a></li></ul></blockquote></div></div></div>

Bruker: Chemical Characterization of Heterogenous Polymeric Materials on the Nanoscale Using Photothermal AFM-IR

Chemical Characterization of Heterogenous Polymeric Materials on the Nanoscale Using Photothermal AFM-IR

This webinar covers numerous academia and industry applications in the field of polymer characterization. 

ICPMS webinars focusing on FTIR Spectroscopy - page 15