<p><strong>Our Library never stops expanding. What are the most recent contributions to LabRulezICPMS Library in the week of 22nd June 2026? Check out new documents from the field of spectroscopy/spectrometry and related techniques!</strong></p><blockquote><p><span style="font-size:20px;">👉 </span><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library"><span style="font-size:20px;"><strong>SEARCH THE LARGEST REPOSITORY OF DOCUMENTS ABOUT SPECTROSCOPY/SPECTROMETRY RELATED TECHNIQUES</strong></span></a></p></blockquote><blockquote><p><strong>👉 Need info about different analytical techniques?</strong> Peek into <a target="_blank" rel="noopener noreferrer" href="https://lcms.labrulez.com/library"><strong>LabRulezLCMS</strong></a> or <a target="_blank" rel="noopener noreferrer" href="https://gcms.labrulez.com/library"><strong>LabRulezGCMS</strong></a> libraries.</p></blockquote><p>This week we bring you technical note by <strong>Agilent Technologies</strong>, application note by <strong>Shimadzu </strong>and other document by <strong>Thermo Fisher Scientific!</strong></p><h3><strong>1. Agilent Technologies: Dual-Cell System (DCS) and Advanced Helium Mode (AHM)</strong></h3><p><strong>Technological developments for higher sensitivity and better interference removal than traditional He-KED</strong></p><ul><li>Technical note</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/te_batch_conversion_tool_9500_icp_ms_5994_9214en_agilent_0a1bba76e2.pdf"><strong>Full PDF for download</strong></a></li></ul><h4><strong>Evolution of Agilent’s Collision Reaction Cell (CRC) technology&nbsp;</strong></h4><ul><li><strong>2001: </strong>Launched the first ICP-MS with CRC—the Agilent 7500c with Octopole Reaction System (ORS)&nbsp;</li><li><strong>2011:</strong> Introduced High Energy Helium Mode (HEHe) using Collision Induced Dissociation (CID)&nbsp;</li><li><strong>2012: </strong>Released the world’s first Triple Quadrupole ICP-MS—the Agilent 8800 ICP-QQQ&nbsp;</li><li><strong>2016:</strong> Launched the second generation Triple Quadrupole ICP-MS with Axial Acceleration—the Agilent 8900 ICP-QQQ&nbsp;</li><li><strong>2026: </strong>Introduced the innovative Dual-Cell System (DCS) and Advanced Helium Mode (AHM) for the Agilent 9500 ICP-QQQ</li></ul><p>Collision/Reaction Cell (CRC) technology is now a standard feature in modern ICP-MS systems, providing a reliable means of eliminating spectral interferences that compromise data quality. ICP-MS systems with integrated CRCs range from single quadrupole (SQ) ICP-MS used in environmental and food analysis, to triple quadrupole ICP-MS (ICP-QQQ) for advanced research applications. For routine applications, Helium Kinetic Energy Discrimination (He KED) mode, commonly referred to as helium mode (He mode), is the most widely used CRC operational mode. The widespread use of He mode is due to its universal effectiveness in reducing a broad range of polyatomic interferences without the need for element-specific optimization.&nbsp;</p><p>Unlike CRCs that rely on reactive cell gases and require complex tuning (often referred to as reaction cells), He mode effectively mitigates many commonly occurring polyatomic ion interferences without the need for intricate adjustments. In contrast, reaction cells often require careful selection of gas type (such as ammonia or oxygen) and tuning parameters based on the specific interfering ions on analytes of interest.&nbsp;</p><p>Building on the simplicity of He mode, Agilent has developed Advanced Helium Mode (AHM) for the <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=10&amp;search=9500"><strong>Agilent 9500 Triple Quadrupole ICP-MS (ICP-QQQ)</strong></a>. AHM represents a breakthrough in interference removal technology, enabled by the newly designed Agilent Dual-Cell System (DCS) and high-speed cell voltage control. These innovations deliver high sensitivity across the mass range and superior interference removal performance for routine applications. Compared to conventional He mode, AHM demonstrates the following improvements:</p><ul><li>Around a 20-fold sensitivity improvement for low-mass elements, such as beryllium (Be) and boron (B)&nbsp;</li><li>Around a 2-fold improvement for mid-to-high mass elements&nbsp;</li><li>A reduction of more than 33% in data acquisition time while maintaining detection limits (DLs), accelerating analytical measurement times&nbsp;</li></ul><p>AHM not only replaces traditional He KED but also consolidates multiple tuning modes including no gas, He, and HEHe into a single, streamlined mode. Integrated into the 9500 ICP-QQQ, AHM is a next-generation standard He mode that is faster, simpler, and delivers higher performance than its predecessor. This technical note describes the performance enhancement mechanisms of the DCS and AHM. It also includes some comparative results with conventional He KED mode to highlight the analytical improvements of AHM.</p><h4><strong>Overview and advantages of AHM&nbsp;</strong></h4><p>Typically, multi-element ICP-MS methods apply no gas mode to the determination of low-mass elements like Be and B due to low sensitivity in traditional He KED mode. Consequently, many routine ICP-MS applications have required multiple tune setups, combining no gas, He, and HEHe. Each mode switch introduces a delay due to cell pressure stabilization requirements.&nbsp;</p><p>In practice, low-mass elements (m/z &lt; 23) are generally unaffected by polyatomic ion interferences, so KED is often unnecessary. Therefore, in AHM, different voltages are applied to the DCS (effectively disabling KED) for low-mass elements, while keeping standard settings for elements with m/z ≥ 23.&nbsp;</p><p>The DCS voltages are dynamically switched in sync with Q2 using a high-speed voltage control circuit, providing over 20× sensitivity improvement for low-mass elements compared to conventional He mode. AHM eliminates the need to run in no gas mode, greatly simplifying the method. As a default approach, AHM alone is suitable for most applications.<sup>1</sup></p><h3><strong>2. Shimadzu: Damping Force Characteristic Test of Suspension Struts [JASO C611]</strong></h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/an_01_01017_en_2fbbb9c247.pdf"><strong>Full PDF for download</strong></a></li></ul><h5><strong>User Benefits</strong></h5><ul><li>Damping force characteristic tests on suspension struts can be performed based on the JASO C611 standard.&nbsp;</li><li>Combination test enables automatic speed change and measurement.&nbsp;</li><li>High responsiveness of the EMT series enables testing at high excitation speed.</li></ul><p>Various components play an important role in achieving a comfortable ride in vehicles. Among them, the suspension strut used in the suspension system is an important component that stabilizes the vehicle body by mitigating the impact caused by uneven road surfaces.&nbsp;</p><p>“JASO C611 Suspension Struts for Automobiles”1), a standard of JASO (Japanese Automotive Standards Organization), established by JSAE, specifies the definition, quality, and test method for suspension struts. There is no international standard that is equivalent to JASO C611.&nbsp;</p><p>In order to improve the performance of suspension struts, it is necessary to measure the damping force against speed by changing the excitation speed. The performance of suspension struts can be confirmed by measuring the response, such as the relationship between speed and damping force and the Lissajous waveform.&nbsp;</p><p>This article introduces an example of the test method “Damping Force Characteristic Test” specified in JASO C611, which was conducted on a Shimadzu EMT series electromagnetic fatigue testing machine.</p><h4><strong>Testing Equipment&nbsp;</strong></h4><p>The EMT-1kNV-50 electromagnetic dynamic and fatigue testing machine was used in this test. Fig. 1 shows a photograph of the testing machine. The electromagnetic actuator with extremely high frequency response enables highly accurate dynamic testing. In this test, the maximum test speed was 0.6 m/s. The EMT seriesis most suitable for testing at such high frequencies.</p><h4><strong>Conclusion&nbsp;</strong></h4><p>A damping force characteristic test on a suspension strut based on JASO C611 was conducted using an EMT series electromagnetic fatigue testing machine and Windows software for 4830. The test conditions were set using the excitation speed, and it was confirmed that the test was accurately controlled as set. The standard “JASO C611 Suspension Struts for Automobiles” referred to this time is derived from “JASO C602 Automotive Parts - Telescopic Shock Absorbers for Suspension Systems”2). Although C602 also prescribes a damping force characteristic test, it is almost equivalent to the C611, and the test machine configuration can be used by replacing the jig.</p><h3><strong>3. Thermo Fisher Scientific: </strong><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products/2206"><strong>Hypulse Surface Analysis System</strong></a></h3><ul><li>Other document</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/Hypulse_DS_0516_EN_05_2025_1998238_WEB_0e44628a5e.pdf"><strong>Full PDF for download</strong></a></li></ul><h4><strong>Key features&nbsp;</strong></h4><ul><li><strong>Unique depth profiling capability</strong>. The femtosecond laser ablation system provides controlled material removal without inducing chemical damage to your sample.&nbsp;</li><li><strong>Fast, efficient XPS</strong>. Quick sample pump-down times, a unique sample viewing system, and high sensitivity for all analysis areas help ensure exceptional data quality, even for highly challenging samples.&nbsp;</li><li><strong>Co-incident additional spectroscopy</strong>. Optimize the information obtained from features of interest with the addition of optional analytical techniques, including ion scattering spectroscopy, reflected electron energy loss spectroscopy, and UV photoelectron spectroscopy.&nbsp;</li><li><strong>Fully featured software. </strong>The latest version of the Avantage Data System is included for data collection and analysis, with the ability to import data into Thermo Scientific Maps Software for correlation with electron microscopy images.</li></ul><h4><strong>Technical highlights&nbsp;</strong></h4><h5><strong>Micro-focused, monochromated aluminum K-alpha X-ray source&nbsp;</strong></h5><ul><li>Computer-controlled quartz-crystal monochromator&nbsp;</li><li>Software-adjustable spot size&nbsp;</li><li>Spot size range: 10–400 μm&nbsp;</li><li>Motorized, water-cooled anode with 16 positions&nbsp;</li></ul><h5><strong>Electron optics and analyzer</strong></h5><ul><li>Electrostatic objective lens&nbsp;</li><li>Full 180° hemispherical μ-metal shielded analyzer&nbsp;</li><li>Continuously selectable pass energy: 1–400 eV&nbsp;</li><li>128-channel, signature-corrected, positionsensitive detector&nbsp;</li><li>Automatic energy scale and transmission function calibration&nbsp;</li></ul><h5><strong>Charge compensation system&nbsp;</strong></h5><ul><li>Patented dual-beam electron and ion source&nbsp;</li><li>Beam energy for charge compensation: 0–5 eV&nbsp;</li></ul><h5><strong>Femtosecond-laser ablation system&nbsp;</strong></h5><ul><li>Fully integrated 1,030 nm pulsed femtosecond-laser source&nbsp;</li><li>Class 1 laser system&nbsp;</li><li>Tunable pulse energy up to 1 mJ&nbsp;</li><li>Computer-controlled attenuation optimizes ablation conditions&nbsp;</li><li>Beam imaging module for system calibration and alignment</li></ul>

News from LabRulezICPMS Library - Week 26, 2026

Electron spectroscopy for chemical analysis of liquids

<p><strong>In the week from June 29, the following webinars await you in the field of atomic and molecular spectroscopy and spectrometry</strong></p><blockquote><h4><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinars"><strong>👉 DETAILS AND REGISTRATION IN THE WEBINARS SECTION</strong></a></h4><p><strong>👉 Search and filter in the largest global database</strong> with over <strong>5 500 GC, LC, MS and spectroscopy webinars</strong>.</p></blockquote><h5><strong>1. Metrohm: Simplifying Through-Container Testing with Raman Spectroscopy in the Pharmaceutical Industry</strong></h5><ul><li>Mo, 29.6.2026 15:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6308">Registration</a></li></ul><p>In this webinar, we will demonstrate a more robust and practical alternative to SORS for see-through Raman analysis.</p><h5><strong>2. SelectScience: End-to-end PAT: Connecting advanced analytics and data across the bioprocess lifecycle</strong></h5><ul><li>Mo, 29.6.2026 16:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6307">Registration</a></li></ul><p>Learn how integrated PAT strategies combining NMR, Raman, IR, and digital workflows enable continuous process understanding, smoother tech transfer, and QbD from development to GMP manufacturing.</p><h5><strong>3. Bruker: Bruker Fluorescence Microscopy Solutions: Automated Imaging and Light-Sheet Microscopy</strong></h5><ul><li>Tu, 30.6.2026 17:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6309">Registration</a></li></ul><p>Discover Bruker’s integrated imaging ecosystem combining light-sheet microscopy, high-content screening, and high-performance data management for scalable, high-quality biological imaging workflows.</p><h5><strong>4. Agilent Technologies: Measuring Diverse Samples with UV/VIS Spectrometers and Integrating Spheres</strong></h5><ul><li>Tu, 30.6.2026 20:30 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6052">Registration</a></li></ul><p>This webinar will discuss diffuse transmission and reflection UV/VIS measurements, including how to perform measurements with Agilent’s Cary 60 UV/VIS Spectrometer.</p><h5><strong>5. Milestone: Unlock Smarter Digestion: AI and the Smart Features that Transform Your Daily Routine</strong></h5><ul><li>We, 1.7.2026 16:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6312">Registration</a></li></ul><p>Learn how Milestone’s intelligent digestion technologies, including MAIA AI Agent, easyTEMP, and SRC, help reduce downtime, simplify workflows, and improve laboratory productivity.</p><h5><strong>6. Bruker: High-Energy XRD - Diffraction Without Limits</strong></h5><ul><li>Th, 2.7.2026 10:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6314">Registration</a></li></ul><p>Join us to explore how high-energy XRD with the D8 ADVANCE HE and D8 DISCOVER HE enables the study of materials under realistic conditions.</p><h5><strong>7. Agilent Technologies: Spectral Flow Cytometry Masterclass - Session 1</strong></h5><ul><li>Fr, 3.7.2026 07:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6316">Registration</a></li></ul><p>Learn how full-spectrum flow cytometry enables high-dimensional cell analysis. Explore spectral flow technology, experimental design, and applications in immunology, oncology, and vaccine research.</p>

Webinars LabRulezICPMS Week 27/2026

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Thermo Scientific Antaris II FT-NIR Analyzer

The Thermo Scientific Antaris™ II FT-NIR Analyzer enables fast, non-destructive analysis without sample preparation, supporting quality control, process monitoring, and method transfer.

<p><strong>The Thermo Scientific Antaris™ II FT-NIR Analyzer is a Fourier Transform Near-Infrared (FT-NIR) analyzer designed for quality control, process monitoring, and method development in industrial environments. Its rugged design and intuitive operation enable reliable analysis directly on the production floor, in warehouses, and in laboratory.</strong></p><p>The system combines analytical performance with flexibility, supporting seamless method development, transfer, and routine operation. The Antaris II platform ensures reproducible results regardless of configuration, user, or environment, making it ideal for standardized workflows and global deployments.</p><p>FT-NIR technology enables fast, non-destructive analysis without sample preparation, significantly improving efficiency and reducing operational costs.</p><h3><span><strong>Key Features</strong></span></h3><ul><li>FT-NIR spectroscopy for rapid, non-destructive analysis</li><li>Excellent method transferability between instruments</li><li>Rugged industrial design for harsh environments</li><li>Internal HeNe laser calibration – no external calibration required</li><li>Stable, frictionless Michelson interferometer</li><li>Automated workflows and SOP-driven operation</li><li>Fully compliant with regulated environments (GMP, 21 CFR Part 11)</li><li>Low cost of ownership and high reliability</li></ul><h3><span><strong>Sampling Capabilities</strong></span></h3><p><span>The system offers flexible sampling configurations that can be adapted to different material types and application requirements.</span></p><ul><li><strong>Reflectance measurements: </strong>solids, powders, pastes</li><li><strong>Transmission measurements: </strong>liquids, films, tablets</li><li>Fiber optics for in-line and remote measurements</li><li>Integrating sphere for diffuse reflectance</li><li>Tablet analyzer module</li><li>Automation options (up to ~120 samples per hour)</li></ul><p><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Antaris_II_FT_NIR_Analyzer_29c4d2264a.jpg" alt="Thermo Scientific Antaris II FT-NIR Analyzer" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Antaris_II_FT_NIR_Analyzer_29c4d2264a.jpg 245w," sizes="100vw" width="1584" height="314"></p><h3><span><strong>Software and Data Analysis</strong></span></h3><p>Support for multiple software platforms depending on application (routine analysis, method development, chemometrics)</p><ul><li><strong>RESULT software</strong> for routine operation and GMP environments</li><li><strong>OMNIC software </strong>for advanced spectral analysis</li><li><strong>The Unscrambler software</strong> for chemometric modeling and data interpretation</li></ul><h3><span><strong>Advantages of FT-NIR Technology</strong></span></h3><ul><li>No sample preparation required</li><li>Non-destructive analysis</li><li>Fast measurement times</li><li>High accuracy and reproducibility</li><li>Lower cost compared to wet chemistry and LC methods</li><li>Suitable for at-line and in-line analysis</li></ul><h3><span><strong>Technical Specifications</strong></span></h3><ul><li><strong>Analyzer Type:</strong> FT-NIR (Fourier Transform Near-Infrared)</li><li><strong>Spectral Range:</strong> 12,000 to 3,800 cm⁻¹ (833–2630 nm)</li><li><strong>Resolution:</strong> 4 cm⁻¹ (standard), 2 cm⁻¹ (optional)</li><li><strong>Detector:</strong> InGaAs</li><li><strong>Source:</strong> Long-life halogen NIR source</li><li><strong>Interferometer:</strong> Michelson, frictionless design</li><li><strong>Wavenumber Accuracy:</strong> ±0.03 cm⁻¹</li><li><strong>Repeatability:</strong> &lt;0.006 cm⁻¹</li><li><strong>Reproducibility (system-to-system):</strong> &lt;0.05 cm⁻¹</li><li><strong>Operating Temperature:</strong> 15–35 °C</li><li><strong>Dimensions (W × D × H):</strong> 40.6 × 68.5 × 33 cm</li><li><strong>Weight:</strong> 47.7 kg</li></ul><h3><span><strong>Typical Applications</strong></span></h3><ul><li>Pharmaceutical industry</li><li>Food and beverage analysis</li><li>Chemical industry</li><li>Polymer and materials analysis</li><li>Raw material identification</li><li>Process analytical technology (PAT, at-line, in-line)</li></ul>

Thermo Scientific Antaris MX FT-NIR Process Analyzer

The Thermo Scientific Antaris™ MX FT-NIR Process Analyzer enables real-time on-line and in-line monitoring, improving product quality, yield, and process efficiency.

<p><strong>The Thermo Scientific Antaris™ MX FT-NIR Process Analyzer is a Fourier Transform Near-Infrared (FT-NIR) analyzer designed for real-time on-line and in-line monitoring of industrial manufacturing processes. It enables continuous measurement of critical quality parameters directly in the process, allowing rapid response to deviations and improved production efficiency.</strong></p><p>Using fiber-optic technology and multi-point monitoring, the system can simultaneously measure multiple locations within a process using a single analyzer. This eliminates time delays between sampling points and provides true time-aligned data, which is essential for dynamic processes.</p><p>The Antaris MX is built for demanding production environments, offering high reliability, reproducibility, and seamless integration into process control systems.</p><h3><span><strong>Key Features</strong></span></h3><ul><li>FT-NIR spectroscopy for <strong>real-time process analysis</strong></li><li><strong>Simultaneous multi-point monitoring</strong> with a single analyzer</li><li>Fiber-optic sampling for remote measurements</li><li><strong>ParaLux™ technology </strong>with no mechanical channel switching</li><li>Continuous internal referencing (background correction)</li><li>High stability, sensitivity, and fast response time</li><li><strong>Rugged design</strong> for industrial environments</li><li>Low cost of ownership and high system uptime</li></ul><h3><span><strong>Sampling Capabilities</strong></span></h3><ul><li>Fiber-optic probes for in-line, on-line, and at-line applications</li><li>Reflectance, transmission, and transflectance measurements</li><li>Simultaneous monitoring of up to 4 process points</li><li>Manual and fully automated sampling</li><li>Specialized probes for fermentation, drying, and slurry processes</li><li>Retractable probes with automated cleaning options</li></ul><h3><span><strong>Software and Data Analysis</strong></span></h3><ul><li><strong>RESULT software </strong>for workflow control and automation</li><li><strong>TQ Analyst™</strong> for chemometric modeling and calibration transfer</li><li><strong>OPC communication </strong>for integration with SCADA/DCS systems</li><li><strong>Compatibility </strong>with LIMS, ERP, and tracking systems (RFID, barcode)</li><li><strong>Automated pass/fail </strong>decision-making</li></ul><h3><span><strong>Advantages of FT-NIR in Process Analysis</strong></span></h3><ul><li>Real-time process feedback</li><li>Non-destructive analysis without sample preparation</li><li>Improved product yield and quality</li><li>Reduced operational costs</li><li>Elimination of delays between measurement and decision</li><li>Support for fully automated process control</li></ul><h3><span><strong>Technical Specifications</strong></span></h3><ul><li><strong>Analyzer Type:</strong> FT-NIR (Fourier Transform Near-Infrared)</li><li><strong>Spectral Range:</strong> 12,000 to 3,800 cm⁻¹ (833–2500 nm)</li><li><strong>Resolution:</strong> 4 cm⁻¹ (standard), 2 cm⁻¹ (optional)</li><li><strong>Detector:</strong> InGaAs</li><li><strong>Source:</strong> Long-life halogen NIR source</li><li><strong>Interferometer:</strong> Michelson, frictionless design</li><li><strong>Wavenumber Accuracy:</strong> ±0.1 cm⁻¹</li><li><strong>Repeatability:</strong> &lt;0.006 cm⁻¹</li><li><strong>Reproducibility:</strong> &lt;0.05 cm⁻¹</li><li><strong>Operating Temperature:</strong> 15–35 °C</li><li><strong>Dimensions:</strong> 48.2 × 40.6 × 24.7 cm</li><li><strong>Weight:</strong> 25.8 kg</li></ul><h3><span><strong>Typical Applications</strong></span></h3><ul><li>Real-time process monitoring (on-line, in-line)</li><li>Raw material identification and control</li><li>Pharmaceutical and chemical industries</li><li>Fermentation and reaction monitoring</li><li>Quality control in production</li><li>Mobile and at-line analysis</li></ul>

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Webinars LabRulezICPMS Week 27/2026

Electron spectroscopy for chemical analysis of liquids

News from LabRulezICPMS Library - Week 26, 2026