Redefine the analysis of advanced high purity materials directly in solid state with the Thermo Scientific™ Element GD Plus™ GD-MS. For high throughput and extra low ppb level detection limits, the Element GD Plus GD-MS is the most convenient and powerful tool for bulk metal analysis and depth profiling in routine and research applications.
The Element GD Plus GD-MS enables analysis of nearly all elements in the periodic table from both conductive and non-conductive materials with the same level of sensitivity and data quality. Analysis of low melting point metals such as gallium are made easy with a dedicated workflow for sample preparation and analysis. This makes GD-MS the reliable standard for any metal analysis.
Almost all elements present in a solid sample can be detected and quantified routinely: many down to the parts per billion (ppb) level.
High productivity and low cost of analysis
The Element GD Plus GD-MS is designed to deliver outstanding sensitivity and accuracy at a high sample throughput, dramatically lowering the cost of your analysis.
- Fast-flow ion source
- User-friendly source design: < 1 min sample exchange
- Short pumping times: < 10 min sample turnaround
- High sample throughput: up to 5 samples/hr
- Less sample preparation: no requirement for acid cleaning of high-purity samples
- Faster sample analysis: no requirement to measure calibration standards
Routine operation
The Element GD Plus GD-MS is designed with routine operation and high throughput at its core.
- Linear dynamic range spanning more than 12 orders of magnitude allows the simultaneous analysis of matrix elements (%), traces (ppm), and ultra-traces (ppb)
- Automatic cross-calibration between different detection modes ensures robust results
- Sample vacuum chamber: eliminates risk of leakage between the sample and the GD cell
- Determine elemental concentrations rapidly within a single scan without calibration standards (using standard RSF approach)
- Best precision within a short analysis time
Thermo Scientific™ Element GD Plus™ GD-MS: Ion Beam Ratio RSD for 10 min measurements of elements at 1000 ppm, 100 ppm and 1 ppm. Data shown for 18 different instruments.
Outstanding limits of detection
The Element GD Plus GD-MS delivers high throughput without compromise. With the highest signal-to-noise ratio and lowest limits of detection, the Element GD Plus GD-MS is the workhorse for ultra-high purity elemental analysis.
- Unique ion source designed for high ion transmission, maximizing the signal analyzed.
- Guaranteed signal-to-noise ratio produces the sub-ppb limits of detection
- Optional CNO option achieves sub-ppm level limits of detection for CNO with no compromise to the through-put of your analysis
- Factor 10 reduction of polyatomic interferences compared to static GD sources
Thermo Scientific™ Element GD Plus™ GD-MS: Typical mass spectrum of 42Ca and 45Sc during the analysis of high purity Ti. (Left) ASTM F1710-08 method using static source. (Right) Fast-flow method using the Element GD Plus GD-MS. Overlapping isobaric interference from 48Ti36Ar2+ and 50Ti40Ar2+ is suppressed by the fast flow source.
Trust in results by high mass resolution
The simplicity of high-resolution ICP-MS allows the most advanced performance, without compromising on straightforward and reliable method development.
- Interference-free measurements for indisputable analytical results
- Any combination of resolution settings can be performed within a single analysis
- Fixed-slit design guarantees maximum stability and reproducibility
- Minimum contribution of high matrix signals on neighboring analyte peaks due to filter lens
Depth profiling with nanometer resolution
Depth profiling is an important tool for elemental analysis of coatings and the assessment of element diffusion across layers.
- Depth resolution from nanometers to hundreds of micrometers
- Determining concentrations of all elements from sub-ppm to 100% without the need for calibration
- Flexible anode diameter for advanced depth profiling a
- Sputter rates can be adjusted for bulk analysis or depth profiling
Thermo Scientific™ Element GD Plus™ GD-MS: Typical crater shape of a depth profile on a copper sample.
Recommended for
- Aerospace: nickel superalloys, composite materials, depth profiling of coatings and diffusion layers
- Microelectronics: copper, alumina powder, sputter targets
- Renewable energy: silicon blocks, wafers, solar cells
- Medical/pharmaceutical/food: stainless steel, alloys
Specifications
- Type: GS Mass Spectrometer
- Dynamic Range: >10¹² Linear with Automatic Cross Calibration
- Mass Resolution: 3 Fixed Resolutions: ≥300, ≥ 4,000, ≥ 10,000
- Mass Stability: 25 ppm/8 hour
- Power: 3-Phase, 230/400 V ± 10%, 50/60 Hz Fused 32 A / Phase
- Sensitivity: >1 x 10¹⁰ Cps (1.6 x 10⁻⁹ A) for Copper Peak (Peak Height, Total Ion Current) in Medium Resolution
- Unit Size: Each
