INVENIO ® X The fully automated advanced R&D Spectrometer

Significance of the topic

Fourier transform infrared spectroscopy (FTIR) is a vital analytical tool across research and industry due to its ability to identify molecular vibrations, monitor reaction kinetics and characterize materials over a broad spectral range. Advances in automation and instrumentation greatly enhance reproducibility, reduce user intervention and expand analytical capabilities, making next generation FTIR platforms essential for modern R&D environments.

Objectives and Overview

The document introduces the INVENIO X spectrometer as the next-generation fully automated R&D FTIR platform. Key goals include demonstrating continuous multispectral measurements from far-infrared through visible/ultraviolet regions without manual component exchange and showcasing its performance in routine and advanced applications.

Methodology

INVENIO X integrates a wear-free INTEGRAL interferometer with an automated three-position beamsplitter changer, seven software-selectable detectors and multiple source options. It supports rapid, slow and step-scan modes, direct emission measurements and an optional Transit channel for fast mid-IR analysis outside the main compartment. The OPUS software suite with an optional touch interface controls data acquisition, processing and specialized workflows.

Instrumentation Used

• INTEGRAL interferometer with automated beamsplitter changer and better than 0.085 cm-1 resolution
• MultiTect detector unit for up to five room-temperature detectors (DTGS, InGaAs, Si, GaP)
• DigiTect user-exchangeable detector slot for MCT or other cooled detectors
• Transit™ channel with board-level MIR DTGS detector for rapid transmission/reflectance
• Up to two internal and two external light sources covering 80 cm-1 to 28,000 cm-1
• Optional modules: FT-Raman RAM II, Hyperion FTIR microscopy, VCD Polarization Modulation (PMA 50), spectroelectrochemistry, PL II photoluminescence, TG-FTIR coupling
• OPUS and OPUS-TOUCH software for data handling, multivariate analysis and regulatory compliance

Main Results and Discussion

The platform’s automatic beamsplitter changer achieved exceptional reproducibility over 100 consecutive measurements, evidencing negligible drift. Emission microscopy of a 1×1 mm2 MIR diode demonstrated outstanding spatial resolution and sensitivity via a direct optical path. FT-Raman spectra of diamond, glass and moissanite were acquired with clear spectral discrimination. High-resolution gas spectroscopy of methane (0.085 cm-1) resolved P-, Q- and R-branches with isotope lines. Broadband transmittance of a red packaging foil was recorded from FIR to VIS/UV in one automated run. Time-resolved spectroelectrochemical measurements captured ferrocyanide oxidation dynamics with 15 ms resolution, while step-scan experiments recorded MIR laser diode switch-on in under 100 ns. VCD measurements of camphor enantiomers achieved detection of extremely weak signals (<10-5 au) with high signal-to-noise and flat baselines.

Benefits and Practical Applications

The INVENIO X offers fully automated multispectral FTIR analysis, minimizing manual intervention and downtime. Its modular detector and source configuration enables rapid method switching for QA/QC, materials research, pharmaceuticals, environmental monitoring and microanalysis. High reproducibility and temporal resolution support kinetic and time-resolved studies, while compatibility with external modules extends its use to Raman, microscopy and spectroelectrochemistry.

Future Trends and Opportunities

Emerging directions include integration of artificial intelligence for spectral interpretation, expansion of high-throughput and in-line process monitoring, development of new detector materials for extended sensitivity, and enhanced coupling with hyphenated techniques such as GC-FTIR and LC-FTIR. Advances in compact, user-friendly interfaces and cloud connectivity will further streamline collaborative R&D workflows.

Conclusion

INVENIO X establishes a new benchmark for automated, full-range FTIR spectroscopy in research and industrial laboratories. Its innovative interferometer, detector technologies and software ecosystem deliver unprecedented flexibility, precision and ease of use, addressing diverse analytical challenges without manual reconfiguration.

References

• Bruker Optics INVENIO X Product Brochure, 2019
• US Patent 7034944
• DE Patent 102018206519-B3