WCPS: Trace Level Analysis of V, As and Se Using He Cell Gas via Kinetic Energy Discrimination and Collisional Dissociation in Acidic Matrices
Posters | 2010 | Agilent TechnologiesInstrumentation
Reliable determination of trace levels of vanadium, arsenic and selenium in acidic matrices is critical for environmental monitoring, food and beverage safety, pharmaceutical quality control and semiconductor manufacturing. Conventional ICP-MS methods often require reactive gases or complex mathematical corrections to remove polyatomic interferences. The implementation of a non-reactive helium collision cell with kinetic energy discrimination (KED) streamlines interference removal and enhances detection capabilities in challenging high-acid samples.
This study evaluates the performance of Agilent’s 7700x ICP-MS equipped with a third-generation octopole reaction system (ORS3). The goals are to:
Calibration standards were prepared at 0, 0.1, 1.0 and 5.0 ppb in a mixed 5% HNO₃ and 5% HCl matrix. Analyses were performed in two modes:
In No Gas mode, high polyatomic interferences from the acid matrix resulted in elevated detection limits (DLs: V 694.5 ppt, As 746.4 ppt, Se 118.3 ppt) and BECs. Switching to He mode dramatically reduced these values (DLs: V 8.38 ppt, As 13.8 ppt, Se 51.1 ppt), and BECs dropped by one to two orders of magnitude. Calibration curves remained linear across the concentration range, demonstrating effective removal of ArCl and other interferences without reactive gases or correction equations.
Future work may extend He-KED strategies to additional trace and ultra-trace elements, integrate automated sample preparation workflows, and apply this approach to complex matrices such as biological fluids, geological samples and industrial process streams. Advances in cell design and software algorithms could further enhance sensitivity, selectivity and speed for high-throughput laboratories.
The Agilent 7700x ORS3 system operating in He mode with kinetic energy discrimination offers a simplified, robust and highly sensitive solution for trace analysis of V, As and Se in acidic matrices. By effectively removing polyatomic interferences, this approach achieves ppt-level detection limits and streamlines routine ICP-MS workflows across environmental, industrial and research applications.
ICP/MS
IndustriesManufacturerAgilent Technologies
Summary
Significance of the Topic
Reliable determination of trace levels of vanadium, arsenic and selenium in acidic matrices is critical for environmental monitoring, food and beverage safety, pharmaceutical quality control and semiconductor manufacturing. Conventional ICP-MS methods often require reactive gases or complex mathematical corrections to remove polyatomic interferences. The implementation of a non-reactive helium collision cell with kinetic energy discrimination (KED) streamlines interference removal and enhances detection capabilities in challenging high-acid samples.
Objectives and Study Overview
This study evaluates the performance of Agilent’s 7700x ICP-MS equipped with a third-generation octopole reaction system (ORS3). The goals are to:
- Demonstrate quantification of V, As and Se at sub-ppt levels in a 5% HNO₃/5% HCl matrix.
- Compare calibration, detection limits and background equivalent concentrations (BECs) in No Gas versus He cell gas modes.
- Assess the practicality of a single-acquisition He-KED approach for routine trace analysis.
Methodology and Instrumentation
Calibration standards were prepared at 0, 0.1, 1.0 and 5.0 ppb in a mixed 5% HNO₃ and 5% HCl matrix. Analyses were performed in two modes:
- No Gas mode, emulating conventional collision cell off-gas conditions.
- He mode with 10 mL/min He flow and 5 V KED voltage for kinetic energy discrimination.
Used Instrumentation
- Agilent 7700x ICP-MS with ORS3 octopole reaction cell.
- Helium collision gas for kinetic energy discrimination.
- MassHunter software for auto-tuning of plasma and ion optics.
Results and Discussion
In No Gas mode, high polyatomic interferences from the acid matrix resulted in elevated detection limits (DLs: V 694.5 ppt, As 746.4 ppt, Se 118.3 ppt) and BECs. Switching to He mode dramatically reduced these values (DLs: V 8.38 ppt, As 13.8 ppt, Se 51.1 ppt), and BECs dropped by one to two orders of magnitude. Calibration curves remained linear across the concentration range, demonstrating effective removal of ArCl and other interferences without reactive gases or correction equations.
Benefits and Practical Applications
- Eliminates the need for reactive cell gases or complex interference correction algorithms.
- Enables simultaneous analysis of multiple trace elements in a single acquisition.
- Maintains accuracy and sensitivity in high-acid matrices containing chloride.
- Improves laboratory throughput and simplifies method development.
Future Trends and Potential Applications
Future work may extend He-KED strategies to additional trace and ultra-trace elements, integrate automated sample preparation workflows, and apply this approach to complex matrices such as biological fluids, geological samples and industrial process streams. Advances in cell design and software algorithms could further enhance sensitivity, selectivity and speed for high-throughput laboratories.
Conclusion
The Agilent 7700x ORS3 system operating in He mode with kinetic energy discrimination offers a simplified, robust and highly sensitive solution for trace analysis of V, As and Se in acidic matrices. By effectively removing polyatomic interferences, this approach achieves ppt-level detection limits and streamlines routine ICP-MS workflows across environmental, industrial and research applications.
Content was automatically generated from an orignal PDF document using AI and may contain inaccuracies.
Similar PDF
WCPS: High Matrix Analysis of As, Se, Cd, Hg, & Pb in Food Digestates Using Inductively Coupled Mass Spectrometry
2011|Agilent Technologies|Posters
High Matrix Analysis of As, Se, Cd, Hg, & Pb in Food Digestates Using Inductively Coupled Mass Spectrometry. L. Craig Jones, Amir Liba, Jon Talbott, & Clint Walker Abstract Calibration Verification Standard Results Results and Discussions Increased regulations regarding the…
Key words
polyatomic, polyatomicomega, omegaoctopole, octopoleqpole, qpoledigested, digesteddigestates, digestatesmode, modeelectrical, electricaltoxic, toxicarcl, arclmonatomic, monatomicrepresentations, representationselements, elementsinterference, interferencemeans
Agilent ICP-MS Journal (September 2009 – Issue 39)
2009|Agilent Technologies|Others
Agilent ICP-MS Journal September 2009 – Issue 39 7700 Series ICP-MS Special Issue Inside this Issue 2 Clearly Better ICP-MS: Introducing the New 7700 Series, Agilent 7700 Series Stars on YouTube 3 New ORS Insures More Effective Interference Removal in…
Key words
icp, icppolyatomic, polyatomicremoval, removalmode, modeagilent, agilentcell, cellplasma, plasmacertified, certifiedhmi, hmiinterferences, interferencesgas, gaselement, elementmetals, metalsmatrix, matrixdrinking
Measuring Inorganic Impurities in Semiconductor Manufacturing
2022|Agilent Technologies|Guides
Applications of ICP-MS Measuring Inorganic Impurities in Semiconductor Manufacturing Application Compendium > Return to table of contents > Search entire document Table of contents ICP-MS and ICP-QQQ in the Semiconductor Industry 4 Agilent Has Three Decades of ICP-MS Experience Driving…
Key words
return, returncontents, contentsicp, icptable, tablecps, cpsppt, pptgas, gassemiconductor, semiconductorconc, concqqq, qqqbec, becdocument, documententire, entiresearch, searchmode
Basic Performance of the Agilent 7700s ICP-MS for the Analysis of Semiconductor Samples
2010|Agilent Technologies|Technical notes
Basic Performance of the Agilent 7700s ICP-MS for the Analysis of Semiconductor Samples Application Note Semiconductor Authors Abstract Junichi Takahashi Agilent ICP-MS systems have become the benchmark for accurate low-level analysis Agilent Technologies of trace contaminants across a wide range…
Key words
semiconductor, semiconductorppt, pptcool, coolplasma, plasmabec, becagilent, agilentimproved, improvedgas, gasicp, icppolyatomic, polyatomicweaklybound, weaklybounddissociation, dissociationcount, countnormalized, normalizedjunichi