Dedicated axial or radial plasma view for superior speed and performance
Technical notes | 2012 | Agilent TechnologiesInstrumentation
Optimizing plasma viewing configurations in inductively coupled plasma optical emission spectrometry improves analysis speed, sensitivity, and resistance to matrix interferences across diverse applications. Dedicated axial and radial views enable tailored performance for trace detection or routine matrix analysis, enhancing the reliability of environmental, industrial, and geological testing.
This overview details the design and benefits of the Agilent 700 Series ICP-OES with dedicated axial or radial plasma viewing. It contrasts these configurations with conventional dual-view systems and demonstrates how modern interface and optical technologies overcome past limitations.
The study evaluated axial versus radial plasma orientations, assessed ionization interference from easily ionized elements, and optimized calibration strategies including internal standards and ionization buffers. Plasma gas flows and interface designs were adjusted to maximize linear dynamic range and minimize matrix effects.
• The cooled cone interface markedly reduced easily ionized element interference and extended the linear dynamic range compared to shear gas and vacuum exhaust designs
• Axial viewing achieved a 5- to 10-fold improvement in detection limits for trace elements
• Radial viewing offered robust matrix tolerance with the plasma tail kept outside the optical path
• Simultaneous full wavelength coverage eliminated the need for multiple measurements, reducing analysis time and argon consumption
Dedicated axial or radial systems in the Agilent 700 Series enable faster multi-element analysis, lower operational costs, improved accuracy across wide concentration ranges, and enhanced robustness against matrix interferences. These advantages support routine environmental monitoring, petrochemical and metallurgical testing, and quality assurance workflows.
Anticipated developments include advanced plasma interface materials to further suppress tail effects, machine learning driven method optimization, higher resolution detectors, and expanded use in real-time process monitoring and rapid contaminant screening.
The Agilent 700 Series ICP-OES demonstrates that dedicated axial and radial plasma viewing, combined with innovative interface and optical technologies, deliver superior speed, sensitivity, and dynamic range compared to dual-view systems. These advances address critical analytical needs and point to ongoing evolution in ICP-OES instrument design.
ICP-OES
IndustriesManufacturerAgilent Technologies
Summary
Importance of the Topic
Optimizing plasma viewing configurations in inductively coupled plasma optical emission spectrometry improves analysis speed, sensitivity, and resistance to matrix interferences across diverse applications. Dedicated axial and radial views enable tailored performance for trace detection or routine matrix analysis, enhancing the reliability of environmental, industrial, and geological testing.
Study Objectives and Overview
This overview details the design and benefits of the Agilent 700 Series ICP-OES with dedicated axial or radial plasma viewing. It contrasts these configurations with conventional dual-view systems and demonstrates how modern interface and optical technologies overcome past limitations.
Methodology and Experimental Setup
The study evaluated axial versus radial plasma orientations, assessed ionization interference from easily ionized elements, and optimized calibration strategies including internal standards and ionization buffers. Plasma gas flows and interface designs were adjusted to maximize linear dynamic range and minimize matrix effects.
Used Instrumentation
- Agilent 700 Series ICP-OES with choice of axial or radial plasma view
- Cooled cone plasma interface for tail deflection and optics protection
- Computer-optimized echelle optical system covering 167–785 nm
- High-performance CCD detector capturing over 33000 emission lines simultaneously
- ICP Expert II software with MultiCal feature for extended dynamic range and results verification
Key Results and Discussion
• The cooled cone interface markedly reduced easily ionized element interference and extended the linear dynamic range compared to shear gas and vacuum exhaust designs
• Axial viewing achieved a 5- to 10-fold improvement in detection limits for trace elements
• Radial viewing offered robust matrix tolerance with the plasma tail kept outside the optical path
• Simultaneous full wavelength coverage eliminated the need for multiple measurements, reducing analysis time and argon consumption
Benefits and Practical Applications
Dedicated axial or radial systems in the Agilent 700 Series enable faster multi-element analysis, lower operational costs, improved accuracy across wide concentration ranges, and enhanced robustness against matrix interferences. These advantages support routine environmental monitoring, petrochemical and metallurgical testing, and quality assurance workflows.
Future Trends and Opportunities
Anticipated developments include advanced plasma interface materials to further suppress tail effects, machine learning driven method optimization, higher resolution detectors, and expanded use in real-time process monitoring and rapid contaminant screening.
Conclusion
The Agilent 700 Series ICP-OES demonstrates that dedicated axial and radial plasma viewing, combined with innovative interface and optical technologies, deliver superior speed, sensitivity, and dynamic range compared to dual-view systems. These advances address critical analytical needs and point to ongoing evolution in ICP-OES instrument design.
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