Analysis of Ultratrace Impurities in High Silicon Matrix Samples by ICP-QQQApplications | 2021 | Agilent Technologies InstrumentationICP/MS, ICP/MS/MSIndustriesSemiconductor Analysis ManufacturerAgilent TechnologiesKey wordssemiconductor, becs, icp, elements, matrix, bec, plasma, gas, silicon, eies, background, omega, lens, trace, deposition, impurities, qqq, level, sampling, used, ppt, cool, bias, foundries, cell, cone, techniquesensure, samples, each, multitune, element, were, signals, prepared, spike, recovery, suppression, evolves, high, rsd, analyte, equivalent, processes, interference, iot, single, widely, ying, industry, sweeps
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5th EditionHandbook of ICP-QQQApplications using theAgilent 8800 and 8900Primer > Return to table of contents> Search entire documentForewordAgilent Technologies launched its 8800 Triple QuadrupoleICP-MS (ICP-QQQ) at the 2012 Winter Conference on PlasmaSpectrochemistry in Tucson, Arizona, USA.By the time the first ICP-QQQ...
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Elemental and Particle Analysis of N-Methyl-2-Pyrrolidone (NMP) by ICP-MS/MS
2022|Agilent Technologies|Applications
Application NoteSemiconductorElemental and Particle Analysis ofN-Methyl-2-Pyrrolidone (NMP) byICP-MS/MSAnalysis of dissolved and particulate inorganicimpurities in two grades of NMP using the Agilent8900 ICP-QQQAuthorIntroductionYoshinori ShimamuraIdeally, analytical quality control (QC) testing procedures should keep pace with thetechnologies they support. This has long been...
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Agilent ICP-MS JournalAugust 2021, Issue 85Optimizing ICP-MS Methodsand PerformancePage 1Optimizing ICP-MS Methodsand PerformancePages 2-3Analysis of Impurities inUltrapure Water Using Agilent8900 ICP-QQQ with HotPlasma and m-LensPages 4-5Space Charge in ICP-MS. WhatCauses It and What Does ItMean for Your Analysis?Page 6This issue...
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Automated Analysis of Ultratrace Elemental Impurities in Isopropyl Alcohol
2022|Agilent Technologies|Applications
Application NoteSemiconductorAutomated Analysis of UltratraceElemental Impurities in IsopropylAlcoholOnline calibration using the IAS AutomatedStandard Addition System (ASAS)AuthorsKazuhiro Sakai and KatsuoMizobuchiAgilent Technologies, JapanRiro KobayashiIAS Inc, JapanIntroductionContamination control is critical in the semiconductor industry. Inorganic impuritiesare of particular concern, as they affect the...
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