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    Ceramic Scoring Wafer

    Manuals
    | 2014 | Restek
    GC columns, Consumables
    Instrumentation
    GC columns, Consumables
    Manufacturer
    Restek
    Industries

    Thermal Desorption Analysis of Si Wafer Contaminants

    Applications
    | N/A | GL Sciences
    GC/MSD, Thermal desorption, GC/SQ
    Instrumentation
    GC/MSD, Thermal desorption, GC/SQ
    Manufacturer
    Shimadzu, CTC Analytics, GL Sciences
    Industries
    Semiconductor Analysis

    Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

    Applications
    | 2020 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing, Semiconductor Analysis

    Monitoring quality parameters in standard cleaning baths

    Applications
    | 2020 | Metrohm
    NIR Spectroscopy
    Instrumentation
    NIR Spectroscopy
    Manufacturer
    Metrohm
    Industries
    Energy & Chemicals

    GC Column Cutting Mini Guide

    Guides
    | 2013 | Thermo Fisher Scientific
    Consumables
    Instrumentation
    Consumables
    Manufacturer
    Thermo Fisher Scientific
    Industries

    GC Column Cutting Mini Guide

    Guides
    | 2013 | Thermo Fisher Scientific
    GC columns, Consumables
    Instrumentation
    GC columns, Consumables
    Manufacturer
    Thermo Fisher Scientific
    Industries

    Online monitoring of sulfuric acid and hydrogen peroxide using Raman spectroscopy

    Applications
    | 2023 | Metrohm
    RAMAN Spectroscopy
    Instrumentation
    RAMAN Spectroscopy
    Manufacturer
    Metrohm
    Industries
    Semiconductor Analysis

    Using a Novel Heartcut Device for Multidimensional GC Peak Sectioning to Reveal Small Peaks Otherwise Obscured by Large Peaks in Mass Chromatograms

    Posters
    | N/A | PerkinElmer
    GC, GC/MSD
    Instrumentation
    GC, GC/MSD
    Manufacturer
    PerkinElmer
    Industries

    Analysis of Impurities in Propane/Propylene Streams Using a Pulsed-Flame Photometric Detector (PFPD)

    Applications
    | N/A | OI Analytical
    GC
    Instrumentation
    GC
    Manufacturer
    Agilent Technologies, OI Analytical
    Industries
    Energy & Chemicals

    Measuring the optical properties of photovoltaic cells using the Agilent Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500

    Applications
    | 2011 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing, Semiconductor Analysis
     

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