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    ASMS: Using ICP-MS/MS with M-Lens for the analysis of high silicon matrix samples

    Posters
    | 2020 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Absolute Reflectance Measurement of Anti-Reflective Film for Solar Cells Using the SolidSpec-3700

    Applications
    | N/A | Shimadzu
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Shimadzu
    Industries
    Materials Testing

    Characterization of Trace Impurities in Silicon Wafers by High Sensitivity Reaction Cell ICP-MS

    Applications
    | 2003 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Determination of Elemental Impurities in Silicon-Carbon Anode Materials for Lithium-Ion Batteries by ICP-OES

    Applications
    | 2023 | Agilent Technologies
    ICP/OES
    Instrumentation
    ICP/OES
    Manufacturer
    Agilent Technologies
    Industries
    Energy & Chemicals , Materials Testing

    Ultratrace Analysis of Solar (Photovoltaic) Grade Bulk Silicon by ICP-MS

    Applications
    | 2008 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    The Measurement of Silicon, Tin, and Titanium in Jet-Engine Oil

    Applications
    | 2010 | Agilent Technologies
    AAS
    Instrumentation
    AAS
    Manufacturer
    Agilent Technologies
    Industries
    Energy & Chemicals

    Quantitative characterization of silica nanoparticles by asymmetric flow FFF‑MALS‑ICP‑QQQ using the Agilent 8800 ICP‑QQQ

    Applications
    | 2016 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Environmental, Food & Agriculture, Materials Testing

    Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)

    Applications
    | 2001 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Determination of Dimethyl-polysiloxanes (DMPS) in Edible Fats and Oils by ICP-OES

    Applications
    | 2021 | Agilent Technologies
    ICP/OES
    Instrumentation
    ICP/OES
    Manufacturer
    Agilent Technologies
    Industries
    Food & Agriculture

    Raman Spectroscopy for Quick Quality Analysis of Diamond Membranes

    Applications
    | 2008 | Metrohm
    RAMAN Spectroscopy
    Instrumentation
    RAMAN Spectroscopy
    Manufacturer
    Metrohm
    Industries
    Materials Testing
     

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