Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)
Applications
| 2001 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Determination of Dimethyl-polysiloxanes (DMPS) in Edible Fats and Oils by ICP-OES
Applications
| 2021 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
Industries
Food & Agriculture
Quality Control of Silicone rubber
Applications
| 2020 | Metrohm
NIR Spectroscopy
Instrumentation
NIR Spectroscopy
Manufacturer
Metrohm
Industries
Materials Testing
Raman Spectroscopy for Quick Quality Analysis of Diamond Membranes