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Near-Infrared Spectroscopy: Quantitative analysis according to ASTM E1655
Technical notes
| 2018 | Metrohm
NIR Spectroscopy
Instrumentation
NIR Spectroscopy
Manufacturer
Metrohm
Industries
Energy & Chemicals
MicroLab Expert Software
Others
| 2016 | Agilent Technologies
Software, FTIR Spectroscopy
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Software, FTIR Spectroscopy
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Agilent Technologies
Industries
Real-time Spectral Correction of Complex Samples using FACT Spectral Deconvolution Software
Technical notes
| 2021 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
Industries
FACT spectral deconvolution
Technical notes
| 2012 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
Industries
ICP-OES Background and Interference Removal
Technical notes
| 2020 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
Industries
APWC: Arsenic(As) and Selenium(Se) analysis in presence of Rare Earth Elements (REEs) by single quadrupole ICP-MS
Posters
| 2017 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Environmental, Food & Agriculture
Rapid Analysis of High-Matrix Environmental Samples Using the Agilent 7500cx ICP-MS
Technical notes
| 2007 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Environmental
Investigations into the use of helium collision mode and aerosol dilution for ultra-trace analysis of metals in mineral reference materials
Applications
| 2013 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Environmental
Optimizing GFAAS Ashing and Atomizing Temperatures using Surface Response Methodology
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| 2018 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Fitted Background Correction (FBC) — fast, accurate and fully-automated background correction
Technical notes
| 2019 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
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