1. Databases

    1. Industries

    1. Instrumentation

    1. Manufacturer

    1. Author

    1. Content Type

    1. Publication Date

    Near-Infrared Spectroscopy: Quantitative analysis according to ASTM E1655

    Technical notes
    | 2018 | Metrohm
    NIR Spectroscopy
    Instrumentation
    NIR Spectroscopy
    Manufacturer
    Metrohm
    Industries
    Energy & Chemicals

    MicroLab Expert Software

    Others
    | 2016 | Agilent Technologies
    Software, FTIR Spectroscopy
    Instrumentation
    Software, FTIR Spectroscopy
    Manufacturer
    Agilent Technologies
    Industries

    Real-time Spectral Correction of Complex Samples using FACT Spectral Deconvolution Software

    Technical notes
    | 2021 | Agilent Technologies
    ICP/OES
    Instrumentation
    ICP/OES
    Manufacturer
    Agilent Technologies
    Industries

    FACT spectral deconvolution

    Technical notes
    | 2012 | Agilent Technologies
    ICP/OES
    Instrumentation
    ICP/OES
    Manufacturer
    Agilent Technologies
    Industries

    ICP-OES Background and Interference Removal

    Technical notes
    | 2020 | Agilent Technologies
    ICP/OES
    Instrumentation
    ICP/OES
    Manufacturer
    Agilent Technologies
    Industries

    APWC: Arsenic(As) and Selenium(Se) analysis in presence of Rare Earth Elements (REEs) by single quadrupole ICP-MS

    Posters
    | 2017 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Environmental, Food & Agriculture

    Rapid Analysis of High-Matrix Environmental Samples Using the Agilent 7500cx ICP-MS

    Technical notes
    | 2007 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Environmental

    Optimizing GFAAS Ashing and Atomizing Temperatures using Surface Response Methodology

    Technical notes
    | 2018 | Agilent Technologies
    AAS
    Instrumentation
    AAS
    Manufacturer
    Agilent Technologies
    Industries

    Investigations into the use of helium collision mode and aerosol dilution for ultra-trace analysis of metals in mineral reference materials

    Applications
    | 2013 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Environmental

    Fitted Background Correction (FBC) — fast, accurate and fully-automated background correction

    Technical notes
    | 2019 | Agilent Technologies
    ICP/OES
    Instrumentation
    ICP/OES
    Manufacturer
    Agilent Technologies
    Industries
     

    Related content


    Webinars LabRulezICPMS Week 13/2024

    Su, 24.3.2024
    LabRulez

    KnowItAll Microplastic Classification

    Mo, 18.3.2024
    LabRulez

    Webinars LabRulezICPMS Week 12/2024

    Su, 17.3.2024
    LabRulez
    Other projects
    Follow us
    More information
    WebinarsAbout usContact usTerms of use
    LabRulez s.r.o., all rights reserved.