Routine Analysis of "Difficult" Alloys Using LECO Glow Discharge

Technical notes
| 2007 | LECO
GD/MP/ICP-AES, Elemental Analysis
Instrumentation
GD/MP/ICP-AES, Elemental Analysis
Manufacturer
LECO
Industries
Materials Testing, Energy & Chemicals

Determination of As, Sb and Se in Difficult Environmental Samples by Hydride Generation

Applications
| 2010 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Environmental

Addressing the challenge of measuring difficult elements using triple quadrupole ICP-MS

Applications
| 2022 | Thermo Fisher Scientific
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Thermo Fisher Scientific
Industries
Environmental

Solutions for Biomaterials Surface Characterization

Brochures and specifications
| 2025 | Anton Paar
Particle characterization, Particle size analysis, Rheometry, Laboratory instruments, Mechanical testing
Instrumentation
Particle characterization, Particle size analysis, Rheometry, Laboratory instruments, Mechanical testing
Manufacturer
Anton Paar
Industries
Materials Testing

Sample Preparation Method and FTIR Analysis Method for Microplastics Sampled from Rivers

Applications
| 2021 | Shimadzu
Sample Preparation, FTIR Spectroscopy
Instrumentation
Sample Preparation, FTIR Spectroscopy
Manufacturer
Shimadzu
Industries
Environmental

Raman-Troubleshooting and Failure Analysis of precision mechanics

Applications
| 2021 | Bruker Optics
RAMAN Spectroscopy
Instrumentation
RAMAN Spectroscopy
Manufacturer
Bruker
Industries
Materials Testing

Feasibility study of ability assessment using fNIRS

Applications
| 2024 | Shimadzu
NIR Spectroscopy
Instrumentation
NIR Spectroscopy
Manufacturer
Shimadzu
Industries
Clinical Research

Analysis of Ceramic Molded Products by Thermal Analysis

Applications
| 2024 | Shimadzu
Thermal Analysis, FTIR Spectroscopy
Instrumentation
Thermal Analysis, FTIR Spectroscopy
Manufacturer
Shimadzu
Industries
Materials Testing

WCPS: Enhancing Helium Mode Performance to Provide Improved Detection Limits for Difficult Elements Including S, P, Fe, and Se

Posters
| 2011 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Food & Agriculture

Method for Charge Compensation on Sigma Probe, Theta Probe and Theta 300

Applications
| 2008 | Thermo Fisher Scientific
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
Other projects
GCMS
LCMS
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