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Capillary GC Troubleshooting Guide: How to Locate Problems and Solve Them
Guides
| 1999 | Merck
GC columns, Consumables
Instrumentation
GC columns, Consumables
Manufacturer
Merck
Industries
The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste
Applications
| N/A | ZOEX/JSB
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Instrumentation
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Manufacturer
JEOL, ZOEX/JSB
Industries
Materials Testing, Semiconductor Analysis
Post-Target Analysis of Halogenated Flame Retardants Using Mass Defect Plots
Posters
| 2014 | LECO
GC/MSD, GC/HRMS, GC/TOF
Instrumentation
GC/MSD, GC/HRMS, GC/TOF
Manufacturer
Agilent Technologies, LECO
Industries
Environmental
Leveraging Cl-H Mass Defect Plots for the Identification of Halogenated Organic Contaminants
Posters
| 2016 | LECO
GC/MSD, GC/HRMS, GC/TOF
Instrumentation
GC/MSD, GC/HRMS, GC/TOF
Manufacturer
Agilent Technologies, LECO
Industries
Environmental
A Guide to Safe Handling of Compressed Gases in the Laboratory
Technical notes
| 2014 | Parker Hannifin
Gas ganerators
Instrumentation
Gas ganerators
Manufacturer
Industries
Biologically and Environmentally Important Organic Compounds: GCMS Library - USER MANUAL
Manuals
| 2021 | Wiley
GC/MSD, Software
Instrumentation
GC/MSD, Software
Manufacturer
Wiley
Industries
Environmental, Clinical Research
GC-APCI IMS of Diesel
Applications
| 2015 | Agilent Technologies
GC/MSD, GC/MS/MS, GC/HRMS, GC/TOF, GC/API/MS, LC/TOF, LC/HRMS, LC/MS, LC/MS/MS
Instrumentation
GC/MSD, GC/MS/MS, GC/HRMS, GC/TOF, GC/API/MS, LC/TOF, LC/HRMS, LC/MS, LC/MS/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals
Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging
Applications
| 2014 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike