Determination of Trace Impurities in High-Purity Copper by Sequential ICP-OES with Axial Viewing
Applications
| 2010 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals
Measurement of TOC in Electroplating Solution Using TOC-V WS
Applications
| N/A | Shimadzu
TOC
Instrumentation
TOC
Manufacturer
Shimadzu
Industries
Energy & Chemicals
Measurement of Hexavalent Chromium in Chromate Conversion Coating and Metal Ions in Eluate
Applications
| 2016 | Shimadzu
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Shimadzu
Industries
Materials Testing
Nickel-Plated Sampler Cones Last Longer
Others
| 2019 | Agilent Technologies
Consumables
Instrumentation
Consumables
Manufacturer
Agilent Technologies
Industries
X-ray Fluorescence Analysis of Lead in Tin Plating Using Theoretical Intensity of Scattered X-rays - Analysis of RoHS Regulated Elements by Energy Dispersive X-ray Fluorescence Spectrometer (EDX)
Applications
| N/A | Shimadzu
X-ray
Instrumentation
X-ray
Manufacturer
Shimadzu
Industries
Materials Testing
Identification of Copper Concentrates Using EDX and XRD
Applications
| 2021 | Shimadzu
X-ray, XRD
Instrumentation
X-ray, XRD
Manufacturer
Shimadzu
Industries
Materials Testing
AAS in drinking water analysis
Others
| 2004 | Shimadzu
AAS
Instrumentation
AAS
Manufacturer
Shimadzu
Industries
Environmental
Select your AA Hollow Cathode Lamp by Element
Posters
| 2018 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Characterization and Quantification of Heavy Metals in Wine Using ICP-OES Spectrometry