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| 2017 | Agilent Technologies
ICP/OES
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Validation of Analysis Method Using ICPMS-2030 Based on USP <233> ELEMENTAL IMPURITIES - PROCEDURES
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| 2020 | Shimadzu
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Quantitative Analysis of Film Thicknesses of Multi-Layer Plating Used on Cards
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| 2018 | Shimadzu
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Materials Testing
A Comparison of the Relative Cost and Productivity of Traditional Metals Analysis Techniques Versus ICP-MS in High Throughput Commercial Laboratories
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| 2005 | Agilent Technologies
ICP/MS
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TC Measurement and Elemental Composition Analysis of Fly Ash – Quantitation by TOC and XRF
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| 2013 | Shimadzu
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WCPS: Fundamental Studies of a Nitrogen Microwave Plasma for Analytical Emission Spectroscopy
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| 2017 | Agilent Technologies
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Agilent Technologies
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Quantitative Analysis of Amount of Deposition and Plating Thickness: Multilayer and Irregular Shaped Sample
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| 2021 | Shimadzu
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Shimadzu
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Linearity Limits for Several Trace Metals Currently Determined by Electrothermal Atomic Absorption Spectrometry
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| 2010 | Agilent Technologies
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Identification Testing of Myo-Inositol Conforming to the European Pharmacopoeia (EP)
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| 2022 | Shimadzu
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Shimadzu
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Nanoparticle Analysis by ICP-MS - Why sensitivity is key
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| 2023 | Agilent Technologies
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Agilent Technologies
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