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WCPS: Ultratrace Analysis of Phosphorus, Boron and Other Impurities in Photovoltaic Silicon and Trichlorosilane by ICP-MS with High Energy Collision Cell
Posters
| 2011 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Using the Agilent Cary 670 FTIR Spectrometer to observe rotational and isotopic bands in CO through high resolution FTIR Spectroscopy
Technical notes
| 2011 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
WPC: Hyphenation of a high-speed laser ablation system to Quadrupole Inductively Coupled Plasma Mass Spectrometry (ICP-MS) for imaging applications
Posters
| 2024 | Thermo Fisher Scientific
Laser ablation, ICP/MS
Instrumentation
Laser ablation, ICP/MS
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
WCPS: Ultra-high speed analysis of soil extracts using an Advanced Valve System installed on an Agilent 5110 SVDV ICP-OES
Posters
| 2017 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Environmental
EA-IRMS: Fast and Precise Isotope Analysis of Liquids on a Delta V Isotope Ratio MS with a High Temperature Conversion Elemental Analyzer
Applications
| 2016 | Thermo Fisher Scientific
Elemental Analysis, GC/HRMS, GC/MSD
Instrumentation
Elemental Analysis, GC/HRMS, GC/MSD
Manufacturer
Thermo Fisher Scientific
Industries
Environmental
Improvement of ICP-MS detectability of phosphorus and titanium in high purity silicon samples using the Agilent 8800 Triple Quadrupole ICP-MS
Applications
| 2013 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
WCPS: ADVANCING PEFORMANCE OF AN AXIALLY VIEWED INDUCTIVELY COUPLED PLASMA OPTICAL EMISSION SPECTROMETER FOR SAMPLES HIGH SOLIDS BY INNOVATIVE TORCH DESIGN
Posters
| 2011 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
WCPS: Determination of Ultra Trace Elements in High Purity Reagents by Automatic Standard Addition Methods Using prepFAST S - ICP-MS/MS
Posters
| 2018 | Agilent Technologies
Sample Preparation, ICP/MS, ICP/MS/MS
Instrumentation
Sample Preparation, ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies, Elemental Scientific
Industries
Energy & Chemicals , Semiconductor Analysis
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike