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    Measuring Inorganic Impurities in Semiconductor Manufacturing

    Guides
    | 2022 | Agilent Technologies
    GC, ICP/MS, Speciation analysis, ICP/MS/MS
    Instrumentation
    GC, ICP/MS, Speciation analysis, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    MP-AES AUTOMATION SOFTWARE PACK

    Others
    | 2016 | Agilent Technologies
    Software, MP/ICP-AES
    Instrumentation
    Software, MP/ICP-AES
    Manufacturer
    Agilent Technologies
    Industries

    The determination of drug tablet concentration in pharmaceutical applications for drug development using the Agilent Cary 60 UV-Vis with fiber optics

    Applications
    | 2011 | Agilent Technologies
    UV–VIS spectrophotometry
    Instrumentation
    UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Pharma & Biopharma

    Characterizing sub-nanometer narrow bandpass filters using a Cary 400/500

    Applications
    | 2011 | Agilent Technologies
    UV–VIS spectrophotometry
    Instrumentation
    UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Characterizing Sub-Nanometer Narrow Bandpass Filters Using an Agilent Cary UV-Vis-NIR

    Applications
    | 2023 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Raw Material Identity Verification in Sterile Manufacturing Using the Agilent RapID Raman System

    Applications
    | 2018 | Agilent Technologies
    RAMAN Spectroscopy
    Instrumentation
    RAMAN Spectroscopy
    Manufacturer
    Agilent Technologies
    Industries
    Pharma & Biopharma, Materials Testing

    Trace Elemental Analysis of Trichlorosilane by Agilent ICP-MS

    Applications
    | 2021 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    APWC: Measurement of nanoparticle components in sunscreens by multi-element screening function of spICP-MS

    Posters
    | 2017 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Others

    WCPS: Nanoparticle Analysis in Cosmetic Samples by Multi-element Screening Function of spICP-MS

    Posters
    | 2018 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Others

    The Measurement of High Optical Densities in the Near-Infrared

    Applications
    | 2022 | Agilent Technologies
    NIR Spectroscopy
    Instrumentation
    NIR Spectroscopy
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing
     

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