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    Measuring Inorganic Impurities in Semiconductor Manufacturing

    Guides
    | 2022 | Agilent Technologies
    GC, ICP/MS, Speciation analysis, ICP/MS/MS
    Instrumentation
    GC, ICP/MS, Speciation analysis, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Trace Elemental Analysis of Trichlorosilane by Agilent ICP-MS

    Applications
    | 2021 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Measuring optical densities over 10 Abs on the Agilent Cary 7000 Universal Measurement Spectrophotometer (UMS)

    Technical notes
    | 2013 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries

    The Measurement of High Optical Densities in the Near-Infrared

    Applications
    | 2022 | Agilent Technologies
    NIR Spectroscopy
    Instrumentation
    NIR Spectroscopy
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Raw Material Identity Verification in Sterile Manufacturing Using the Agilent RapID Raman System

    Applications
    | 2018 | Agilent Technologies
    RAMAN Spectroscopy
    Instrumentation
    RAMAN Spectroscopy
    Manufacturer
    Agilent Technologies
    Industries
    Pharma & Biopharma, Materials Testing

    Ultratrace measurement of calcium in ultrapure water using the Agilent 8800 Triple Quadrupole ICP-MS

    Applications
    | 2012 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    APWC: Measurement of nanoparticle components in sunscreens by multi-element screening function of spICP-MS

    Posters
    | 2017 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Others

    Verifying Raw Materials by Spatially Offset Raman Spectroscopy

    Technical notes
    | 2018 | Agilent Technologies
    RAMAN Spectroscopy
    Instrumentation
    RAMAN Spectroscopy
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Agilent I-AS Clean Autosampler

    Others
    | 2022 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries

    WCPS: Nanoparticle Analysis in Cosmetic Samples by Multi-element Screening Function of spICP-MS

    Posters
    | 2018 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Others
     

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