Using the Agilent Cary 670 FTIR Spectrometer to observe rotational and isotopic bands in CO through high resolution FTIR Spectroscopy
Technical notes
| 2011 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Ultra-high speed analysis of soil extracts using an Advanced Valve System installed on an Agilent 5110 SVDV ICP-OES
Applications
| 2016 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Environmental
Maximizing productivity for high matrix sample analysis using the Agilent 7900 ICP-MS with ISIS 3 discrete sampling system
Applications
| 2014 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Environmental
WCPS: Ultratrace Analysis of Phosphorus, Boron and Other Impurities in Photovoltaic Silicon and Trichlorosilane by ICP-MS with High Energy Collision Cell
Posters
| 2011 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
WCPS: Determination of Ultra Trace Elements in High Purity Reagents by Automatic Standard Addition Methods Using prepFAST S - ICP-MS/MS
Posters
| 2018 | Agilent Technologies
Sample Preparation, ICP/MS, ICP/MS/MS
Instrumentation
Sample Preparation, ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies, Elemental Scientific
Industries
Energy & Chemicals , Semiconductor Analysis
WCPS: Ultra-high speed analysis of soil extracts using an Advanced Valve System installed on an Agilent 5110 SVDV ICP-OES
Posters
| 2017 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Environmental
WCPS: ADVANCING PEFORMANCE OF AN AXIALLY VIEWED INDUCTIVELY COUPLED PLASMA OPTICAL EMISSION SPECTROMETER FOR SAMPLES HIGH SOLIDS BY INNOVATIVE TORCH DESIGN
Posters
| 2011 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
WCPS: Ultra High Throughput Analysis of Mineral Digests Using a Novel, Multi-Loop Sample Introduction System with ICP-MS (PC 094)
Posters
| 2011 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Environmental
Improvement of ICP-MS detectability of phosphorus and titanium in high purity silicon samples using the Agilent 8800 Triple Quadrupole ICP-MS
Applications
| 2013 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Rapid screening of brain tissue with a high spatial resolution over large analysis areas using Agilent’s 670 and 620 FTIR imaging analysis