Determination of Extractable and Leachable Elements Using ICP-MS

Applications
| 2022 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Pharma & Biopharma

Determination of Gold, Palladium, and Platinum in Noble Metal Ores Prepared by Fire Assay

Applications
| 2018 | Agilent Technologies
GD/MP/ICP-AES
Instrumentation
GD/MP/ICP-AES
Manufacturer
Agilent Technologies
Industries
Environmental

WCPS: Direct determination of Al, B, Co, Cr, Mo, Ti, V and Zr in HF acid-digested nickel alloy using the Agilent 4210 MP-AES

Posters
| 2017 | Agilent Technologies
GD/MP/ICP-AES
Instrumentation
GD/MP/ICP-AES
Manufacturer
Agilent Technologies
Industries
Materials Testing

How to Reduce ICP-OES Remeasurement Caused by Sample Problems and Errors

Guides
| 2019 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies, Elemental Scientific
Industries

Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

Applications
| 2020 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis

Rapid, Automated, Quality Control Measurements of Diffraction Grating Efficiency

Applications
| 2018 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing

Synchronous Vertical Dual View (SVDV) for superior speed and performance

Technical notes
| 2016 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries

Synchronous Vertical Dual View (SVDV) for superior speed and performance

Technical notes
| 2014 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries

Determination of exchangeable cations in soil extracts using the Agilent 4100 Microwave Plasma-Atomic Emission Spectrometer

Applications
| 2012 | Agilent Technologies
GD/MP/ICP-AES
Instrumentation
GD/MP/ICP-AES
Manufacturer
Agilent Technologies
Industries

Determination of trace elements in ultrapure semiconductor grade sulfuric acid using the Agilent 8900 ICP-QQQ in MS/MS mode

Applications
| 2018 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Other projects
GCMS
LCMS
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