Applications from Agilent Technologies | LabRulez ICPMS

Direct Analysis of Photoresist and Related Solvents Using the Agilent 7500cs ICP-MS

Applications

| 2004 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

The deep ultraviolet spectroscopic properties of a next-generation photoresist

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Determination of Ultratrace Impurities in Semiconductor Photoresist Using ICP-MS/MS

Applications

| 2023 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Trace level analysis of sulfur, phosphorus, silicon and chlorine in NMP using the Agilent 8800 Triple Quadrupole ICP-MS

Applications

| 2013 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Pharma & Biopharma

Low reflectance measurements using the ‘VW’ technique

Technical notes

| 2011 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

The determination of thin film thickness using reflectance spectroscopy

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Multielement Nanoparticle Analysis of Semiconductor Process Chemicals Using spICP-QQQ

Applications

| 2019 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Determination of trace elements in ultrapure semiconductor grade sulfuric acid using the Agilent 8900 ICP-QQQ in MS/MS mode

Applications

| 2018 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Determination of ultra trace elements in high purity hydrogen peroxide with Agilent 8900 ICP-QQQ

Applications

| 2016 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Automated Analysis of Semiconductor Grade Hydrogen Peroxide and DI Water using ICP-QQQ

Applications

| 2018 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Applications from Agilent Technologies | LabRulez ICPMS

Direct Analysis of Photoresist and Related Solvents Using the Agilent 7500cs ICP-MS

The deep ultraviolet spectroscopic properties of a next-generation photoresist

Determination of Ultratrace Impurities in Semiconductor Photoresist Using ICP-MS/MS

Trace level analysis of sulfur, phosphorus, silicon and chlorine in NMP using the Agilent 8800 Triple Quadrupole ICP-MS

Low reflectance measurements using the ‘VW’ technique

The determination of thin film thickness using reflectance spectroscopy

Multielement Nanoparticle Analysis of Semiconductor Process Chemicals Using spICP-QQQ

Determination of trace elements in ultrapure semiconductor grade sulfuric acid using the Agilent 8900 ICP-QQQ in MS/MS mode

Determination of ultra trace elements in high purity hydrogen peroxide with Agilent 8900 ICP-QQQ

Automated Analysis of Semiconductor Grade Hydrogen Peroxide and DI Water using ICP-QQQ

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