ICPMS
More information
WebinarsAbout usContact usTerms of use
LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike

Applications from Agilent Technologies - page 8

A Comparison of the Relative Cost and Productivity of Traditional Metals Analysis Techniques Versus ICP-MS in High Throughput Commercial Laboratories

Technical notes
| 2005 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries

Using the Agilent Cary 670 FTIR Spectrometer to observe rotational and isotopic bands in CO through high resolution FTIR Spectroscopy

Technical notes
| 2011 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries

Ultra-high speed analysis of soil extracts using an Advanced Valve System installed on an Agilent 5110 SVDV ICP-OES

Applications
| 2016 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Environmental

Maximizing productivity for high matrix sample analysis using the Agilent 7900 ICP-MS with ISIS 3 discrete sampling system

Applications
| 2014 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Environmental

WCPS: Ultratrace Analysis of Phosphorus, Boron and Other Impurities in Photovoltaic Silicon and Trichlorosilane by ICP-MS with High Energy Collision Cell

Posters
| 2011 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

WCPS: Determination of Ultra Trace Elements in High Purity Reagents by Automatic Standard Addition Methods Using prepFAST S - ICP-MS/MS

Posters
| 2018 | Agilent Technologies
Sample Preparation, ICP/MS, ICP/MS/MS
Instrumentation
Sample Preparation, ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies, Elemental Scientific
Industries
Energy & Chemicals , Semiconductor Analysis

WCPS: Ultra-high speed analysis of soil extracts using an Advanced Valve System installed on an Agilent 5110 SVDV ICP-OES

Posters
| 2017 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Environmental

WCPS: Ultra High Throughput Analysis of Mineral Digests Using a Novel, Multi-Loop Sample Introduction System with ICP-MS (PC 094)

Posters
| 2011 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Environmental

WCPS: ADVANCING PEFORMANCE OF AN AXIALLY VIEWED INDUCTIVELY COUPLED PLASMA OPTICAL EMISSION SPECTROMETER FOR SAMPLES HIGH SOLIDS BY INNOVATIVE TORCH DESIGN

Posters
| 2011 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries

Improvement of ICP-MS detectability of phosphorus and titanium in high purity silicon samples using the Agilent 8800 Triple Quadrupole ICP-MS

Applications
| 2013 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Other projects
GCMS
LCMS
Follow us
FacebookLinkedInYouTube
More information
WebinarsAbout usContact usTerms of use
LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike