Applications from the field of Materials Testing | LabRulez ICPMS

The characterization of optical components using the Cary Deep UV spectrophotometer and ‘VW’ specular reflectance accessory

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

The deep ultraviolet spectroscopic properties of a next-generation photoresist

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Measuring diffuse refl ectance of solid samples with the Agilent Cary 60 UV-Vis

Applications

| 2012 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Transmission Measurements of Solid Samples at Variable Angles of Incidence by UV-Vis

Applications

| 2024 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

High Temperature Dehydration Studies Using UV-Vis-NIR Diffuse Reflectance Spectroscopy

Applications

| 2023 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Measuring the reflectance of very small samples using the Agilent Cary 60 Remote Diffuse Reflectance Accessory (DRA)

Applications

| 2012 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Spectrophotometric Spatial Profiling of Coated Optical Wafers

Applications

| 2020 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Evaluation of the Cary Absolute Specular Reflectance Accessory for the Measurement of Optical Constants of Thin Films

Applications

| 2023 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

Applications

| 2020 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Automated, Unattended, Multi-Angle Transmission and Absolute Reflection Measurements

Applications

| 2022 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Applications from the field of Materials Testing | LabRulez ICPMS

The characterization of optical components using the Cary Deep UV spectrophotometer and ‘VW’ specular reflectance accessory

The deep ultraviolet spectroscopic properties of a next-generation photoresist

Measuring diffuse refl ectance of solid samples with the Agilent Cary 60 UV-Vis

Transmission Measurements of Solid Samples at Variable Angles of Incidence by UV-Vis

High Temperature Dehydration Studies Using UV-Vis-NIR Diffuse Reflectance Spectroscopy

Measuring the reflectance of very small samples using the Agilent Cary 60 Remote Diffuse Reflectance Accessory (DRA)

Spectrophotometric Spatial Profiling of Coated Optical Wafers

Evaluation of the Cary Absolute Specular Reflectance Accessory for the Measurement of Optical Constants of Thin Films

Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

Automated, Unattended, Multi-Angle Transmission and Absolute Reflection Measurements

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