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    Applications from the field of Materials Testing | LabRulez ICPMS

    RoHS Screening Analysis by EDX

    Applications
    | 2022 | Shimadzu
    X-ray
    Instrumentation
    X-ray
    Manufacturer
    Shimadzu
    Industries
    Materials Testing

    Inspection of Defects in an Automotive Inverter Component with X-Ray Inspection System

    Applications
    | 2023 | Shimadzu
    X-ray
    Instrumentation
    X-ray
    Manufacturer
    Shimadzu
    Industries
    Materials Testing

    Instruments for Analyzing / Evaluating Electronic Device

    Brochures and specifications
    | 2022 | Shimadzu
    GC/MSD, HeadSpace, Thermal desorption, Pyrolysis, GC/SQ, Ion chromatography, NIR Spectroscopy, UV–VIS spectrophotometry, ICP/MS, ICP/OES, AAS, FTIR Spectroscopy, Microscopy, X-ray, TOC
    Instrumentation
    GC/MSD, HeadSpace, Thermal desorption, Pyrolysis, GC/SQ, Ion chromatography, NIR Spectroscopy, UV–VIS spectrophotometry, ICP/MS, ICP/OES, AAS, FTIR Spectroscopy, Microscopy, X-ray, TOC
    Manufacturer
    Shimadzu
    Industries
    Materials Testing, Semiconductor Analysis

    Analysis of Black Rubber Diaphragm by FTIR and EDX

    Applications
    | N/A | Shimadzu
    FTIR Spectroscopy, X-ray
    Instrumentation
    FTIR Spectroscopy, X-ray
    Manufacturer
    Shimadzu
    Industries
    Materials Testing

    Shimadzu FTIR talk letter Vol. 30

    Others
    | 2019 | Shimadzu
    FTIR Spectroscopy, X-ray
    Instrumentation
    FTIR Spectroscopy, X-ray
    Manufacturer
    Shimadzu
    Industries
    Materials Testing

    Measurement of Lead in Lead-Free Solder by ICP-AES, FAAS and EDX

    Applications
    | 2012 | Shimadzu
    AAS, MP/ICP-AES, X-ray
    Instrumentation
    AAS, MP/ICP-AES, X-ray
    Manufacturer
    Shimadzu
    Industries
    Materials Testing

    Analysis of polymer granulate by near-infrared spectroscopy

    Applications
    | N/A | Metrohm
    NIR Spectroscopy
    Instrumentation
    NIR Spectroscopy
    Manufacturer
    Metrohm
    Industries
    Materials Testing

    Measuring the cover and shade protection factors of synthetic shadecloth

    Applications
    | 2011 | Agilent Technologies
    UV–VIS spectrophotometry
    Instrumentation
    UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    The determination of thin film thickness using reflectance spectroscopy

    Applications
    | 2011 | Agilent Technologies
    UV–VIS spectrophotometry
    Instrumentation
    UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Measuring the optical properties of photovoltaic cells using the Agilent Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500

    Applications
    | 2011 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing, Semiconductor Analysis
     

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    LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike