ICPMS webinars focusing on X-ray - page 2

Elemental Analysis Made Easy: Innovative Solutions For Food & Environmental Testing

Elemental Analysis Made Easy: Innovative Solutions For Food & Environmental Testing

Join Shimadzu’s Digital Classroom to explore advanced elemental analysis solutions—ALTRACE EDXRF, ICPMS 2040/2050, and LC-ICPMS—designed for faster, more accurate food and environmental testing.
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Already taken place Th, 13.11.2025
Shimadzu Corporation
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Elemental Analysis Made Easy: Innovative Solutions For Food & Environmental Testing
T-AERO – A Complete Solution for Sampling Airborne Particulate Matter

T-AERO – A Complete Solution for Sampling Airborne Particulate Matter

This webinar will demonstrate Bruker’s T-AERO, an innovative approach for sampling particle fractions in the air for subsequent analysis of toxic elements.
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Already taken place We, 12.11.2025
Bruker
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T-AERO – A Complete Solution for Sampling Airborne Particulate Matter
Explore damage-free XPS depth profiling with the Hypulse Surface Analysis System

Explore damage-free XPS depth profiling with the Hypulse Surface Analysis System

Join us as we introduce the Hypulse System and highlight how it can help you revolutionize XPS depth profiling.
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Already taken place Tu, 11.11.2025
Thermo Fisher Scientific
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Explore damage-free XPS depth profiling with the Hypulse Surface Analysis System
Exploring Multi-Field Layer Thickness Capabilities with Micro-XRF in Scanning Electron Microscope

Exploring Multi-Field Layer Thickness Capabilities with Micro-XRF in Scanning Electron Microscope

In this webinar, we will introduce the physical principles behind micro-XRF-based layer thickness analysis and demonstrate the layer thickness calculation procedures.
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Already taken place Tu, 4.11.2025
Bruker
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Exploring Multi-Field Layer Thickness Capabilities with Micro-XRF in Scanning Electron Microscope
QUANTAX WDS: Advancing Microanalysis Beyond the Limits of SEM EDS

QUANTAX WDS: Advancing Microanalysis Beyond the Limits of SEM EDS

Discover how QUANTAX WDS enhances SEM microanalysis with superior spectral resolution, sensitivity, and light element detection — expanding what’s possible beyond EDS.
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Already taken place Th, 30.10.2025
Bruker
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QUANTAX WDS: Advancing Microanalysis Beyond the Limits of SEM EDS
Maximize Your XRD Efficiency with the XRDynamic Autosampler

Maximize Your XRD Efficiency with the XRDynamic Autosampler

Discover the Anton Paar XRDynamic Autosampler—boosting XRD throughput, flexibility, and automation for up to 105 samples. Streamline routine and advanced materials research.
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Already taken place Th, 2.10.2025
Anton Paar
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Maximize Your XRD Efficiency with the XRDynamic Autosampler
Spatially Resolved Geochemistry: micro-XRF Applications in Peer-Reviewed Geoscience

Spatially Resolved Geochemistry: micro-XRF Applications in Peer-Reviewed Geoscience

Discover how micro-XRF drives advances in geoscience. Learn its applications in mineral exploration, trace elements, sedimentation, and planetary samples.
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Already taken place Tu, 30.9.2025
Bruker
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Spatially Resolved Geochemistry: micro-XRF Applications in Peer-Reviewed Geoscience
Advanced analytical methods in polymer science, Part 1

Advanced analytical methods in polymer science, Part 1

Free webinar on polymer science! Learn how rheology, FTIR, NIR, Raman, XRF, and XRD enhance polymer analysis, quality control, and material design. Live sessions with expert speakers.
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Already taken place Tu, 30.9.2025
Thermo Fisher Scientific
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Advanced analytical methods in polymer science, Part 1
Optimization of Electrolytic Refining Processes: Advanced Monitoring of Liquids with ED-XRF

Optimization of Electrolytic Refining Processes: Advanced Monitoring of Liquids with ED-XRF

Discover how ED-XRF is revolutionizing electrolytic refining of precious metals. Learn fundamentals, monitoring challenges, and see real-world process improvements.
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Already taken place Th, 25.9.2025
SPECTRO Analytical Instruments
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Optimization of Electrolytic Refining Processes: Advanced Monitoring of Liquids with ED-XRF
 Peeling Back the Layers: Thickness Analysis by Means of micro-XRF

Peeling Back the Layers: Thickness Analysis by Means of micro-XRF

Explore the basics and applications of micro-XRF layer analysis. Learn its strengths, limitations, and real-world use cases for materials science, semiconductors, and R&D.
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Already taken place Tu, 23.9.2025
Bruker
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 Peeling Back the Layers: Thickness Analysis by Means of micro-XRF
 

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