ICPMS webinars focusing on X-ray - page 2

Rare Earth Magnet Analysis: The Role of XRF in Production and Recycling

Rare Earth Magnet Analysis: The Role of XRF in Production and Recycling

Learn how small-spot ED-XRF enables fast, digestion-free analysis of rare earth elements in permanent magnets, supporting quality control, recycling, and regulatory compliance.
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Already taken place Th, 5.2.2026
SPECTRO Analytical Instruments
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Rare Earth Magnet Analysis: The Role of XRF in Production and Recycling
Understanding the Difference Between Type and Control Standards in Elemental Analysis

Understanding the Difference Between Type and Control Standards in Elemental Analysis

Discover how type and control standards enhance calibration, precision and QC stability in arc/spark OES and XRF analysis, with practical software integration tips.
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Already taken place Tu, 16.12.2025
SPECTRO Analytical Instruments
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Understanding the Difference Between Type and Control Standards in Elemental Analysis
Making XRF Easy: Smarter Tools for Better Results in Industry & Development

Making XRF Easy: Smarter Tools for Better Results in Industry & Development

Join us to find out how state-of-the-art XRF software solutions can make your life easier and help you to produce more accurate results.
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Already taken place We, 3.12.2025
Bruker
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Making XRF Easy: Smarter Tools for Better Results in Industry & Development
Quantifying Historic Pesticide Residues on Collections: Practical Approaches with micro-XRF

Quantifying Historic Pesticide Residues on Collections: Practical Approaches with micro-XRF

Learn how to quantify toxic metal pesticide residues on heritage objects using adapted XRF workflows. Discover case studies, best practices, and validation with mock-up samples.
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Already taken place Th, 27.11.2025
Bruker
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Quantifying Historic Pesticide Residues on Collections: Practical Approaches with micro-XRF
Applied Mineralogy: Insights from Powder Diffraction

Applied Mineralogy: Insights from Powder Diffraction

In this webinar, experts from the University of Rome will explore how diffraction continues to advance modern mineralogy.
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Already taken place Th, 20.11.2025
Thermo Fisher Scientific
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Applied Mineralogy: Insights from Powder Diffraction
Structural Analysis of Battery Components and Materials Using XRD, XRM / Micro-CT and EBSD

Structural Analysis of Battery Components and Materials Using XRD, XRM / Micro-CT and EBSD

Join us to explore how XRD, XRM, and EBSD solutions can be combined to unlock deeper insights into materials and processes critical to the battery industry.
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Already taken place Tu, 18.11.2025
Bruker
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Structural Analysis of Battery Components and Materials Using XRD, XRM / Micro-CT and EBSD
Elemental Analysis Made Easy: Innovative Solutions For Food & Environmental Testing

Elemental Analysis Made Easy: Innovative Solutions For Food & Environmental Testing

Join Shimadzu’s Digital Classroom to explore advanced elemental analysis solutions—ALTRACE EDXRF, ICPMS 2040/2050, and LC-ICPMS—designed for faster, more accurate food and environmental testing.
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Already taken place Th, 13.11.2025
Shimadzu Corporation
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Elemental Analysis Made Easy: Innovative Solutions For Food & Environmental Testing
T-AERO – A Complete Solution for Sampling Airborne Particulate Matter

T-AERO – A Complete Solution for Sampling Airborne Particulate Matter

This webinar will demonstrate Bruker’s T-AERO, an innovative approach for sampling particle fractions in the air for subsequent analysis of toxic elements.
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Already taken place We, 12.11.2025
Bruker
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T-AERO – A Complete Solution for Sampling Airborne Particulate Matter
Explore damage-free XPS depth profiling with the Hypulse Surface Analysis System

Explore damage-free XPS depth profiling with the Hypulse Surface Analysis System

Join us as we introduce the Hypulse System and highlight how it can help you revolutionize XPS depth profiling.
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Already taken place Tu, 11.11.2025
Thermo Fisher Scientific
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Explore damage-free XPS depth profiling with the Hypulse Surface Analysis System
Exploring Multi-Field Layer Thickness Capabilities with Micro-XRF in Scanning Electron Microscope

Exploring Multi-Field Layer Thickness Capabilities with Micro-XRF in Scanning Electron Microscope

In this webinar, we will introduce the physical principles behind micro-XRF-based layer thickness analysis and demonstrate the layer thickness calculation procedures.
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Already taken place Tu, 4.11.2025
Bruker
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Exploring Multi-Field Layer Thickness Capabilities with Micro-XRF in Scanning Electron Microscope
 

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