From Manufacturing to Recycling: X-Ray Tech in the Battery Life Cycle

From Manufacturing to Recycling: X-Ray Tech in the Battery Life Cycle

In this live online seminar, our experts will explain what XRD, XRF and XRM can do for you! In lab sessions, we will showcase our devices and provide valuable tips and tricks.
RECORD
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Already taken place Tu, 25.6.2024
Bruker
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From Manufacturing to Recycling: X-Ray Tech in the Battery Life Cycle
Coatings Evaluation by Handheld FTIR

Coatings Evaluation by Handheld FTIR

Learn how the Agilent 4300 can easily assess coating ID, quality, authenticity and wear delivering an actionable result in less than 30 seconds.
RECORD
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Already taken place Mo, 25.11.2024
Agilent Technologies
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Coatings Evaluation by Handheld FTIR
Latest developments in PMI technologies

Latest developments in PMI technologies

Join this webinar to explore the latest capabilities of XRF and LIBS technologies for PMI.
RECORD
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Already taken place Sa, 31.12.2022
Thermo Fisher Scientific
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Latest developments in PMI technologies
Thermal Analysis of Thermoset Materials

Thermal Analysis of Thermoset Materials

This webinar discusses the most important thermal properties of thermosets and describes useful thermal analysis techniques used to analyze them.
Th, 24.9.2026 16:00 CET
Mettler-Toledo
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Thermal Analysis of Thermoset Materials
Identification and Quantification of Gases with FT-IR

Identification and Quantification of Gases with FT-IR

This webinar will focus on how FTIR spectroscopy is utiliztexed using different hardware and software approaches to identify the composition of complex gas mixtures
RECORD
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Already taken place Sa, 31.12.2022
Bruker
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Identification and Quantification of Gases with FT-IR
Atomic Force Microscopy Methods for Semiconductor Failure Analysis

Atomic Force Microscopy Methods for Semiconductor Failure Analysis

Join us for this webinar to hear about AFM operating modes for failure analysis, with relevant information provided for each mode.
RECORD
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Already taken place We, 28.5.2025
Bruker
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Atomic Force Microscopy Methods for Semiconductor Failure Analysis
INVENIO for Analytical Centers

INVENIO for Analytical Centers

In the free-of-charge webinar we will focus on the difficulties in analytical labs and explain which features of INVENIO can help in such situations.
RECORD
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Already taken place Sa, 31.12.2022
Bruker
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INVENIO for Analytical Centers
Enhancing food safety labs with rapid detection of Salmonella, Listeria and moulds

Enhancing food safety labs with rapid detection of Salmonella, Listeria and moulds

This webinar focuses on advanced methodologies for detecting microorganisms, including rapid techniques such as MALDI-TOF MS and FTIR-spectroscopy.
RECORD
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Already taken place We, 19.2.2025
New Food magazine
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Enhancing food safety labs with rapid detection of Salmonella, Listeria and moulds
From Deep Space to Deep Learning. State of the Art Imaging of Extraterrestrial Samples

From Deep Space to Deep Learning. State of the Art Imaging of Extraterrestrial Samples

Learn about some of the newest analytical techniques that help us to understand the formation of the universe, and how to best study return mission samples.
RECORD
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Already taken place Tu, 7.11.2023
Wiley
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From Deep Space to Deep Learning. State of the Art Imaging of Extraterrestrial Samples
High sensitivity Silicon QC using FT-IR Spectroscopy

High sensitivity Silicon QC using FT-IR Spectroscopy

In an upcoming free-of-charge two-part webinar we will introduce you Bruker’s high sensitivity solutions for semiconductor quality control using FT-IR spectroscopy.
RECORD
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Already taken place Sa, 31.12.2022
Bruker
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High sensitivity Silicon QC using FT-IR Spectroscopy
 

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