Organic contamination presents a persistent challenge across industries, particularly when particles are small, embedded, or difficult to isolate.

Explore how handheld XRF, micro-XRF, and SEM-EDS support battery material analysis. Learn to choose the right technique based on sensitivity, resolution, and application needs.

Learn how to prevent alloy mix-ups using PMI strategies. Discover when to apply grade identification or verification, and explore real workflows with mobile OES, handheld XRF, and structured metal databases.

The difference in technology from FT-IR vs. FT-NIR and how it works.

In collaboration with PerkinElmer, this presentation will explore the critical role of analytical chemistry and thermal analysis in ensuring battery efficiency, safety, and performance.

Discover how automation in sample preparation and ED-XRF improves reproducibility, reduces errors, and enhances throughput for materials like cement, slag, and ores in modern laboratories.

Explore the basics and applications of micro-XRF layer analysis. Learn its strengths, limitations, and real-world use cases for materials science, semiconductors, and R&D.

Explore PerkinElmer's Pyris 9 Series and discover how next-gen TGA, DSC, and STA instruments are reshaping thermal analysis in pharma, polymers, and advanced materials.

The role Scanning Electron Microscopy (SEM), Focused Ion Beam-Scanning Electron Microscopy (FIB-SEM), and other techniques in characterizing lithium-ion battery materials.

Bruker has held a webinar illustrating how FT-IR can assist in R&D or process control by delivering in-depth analysis of semiconductor materials and devices.