Enhanced Data Capture for 3D Optical Profilers
Collect richer, more reliable data on difficult surfaces
In this webinar, we’ll explore the innovative Enhanced Data Capture measurement technique and demonstrate how it unlocks richer, more reliable data on surfaces that are traditionally difficult to measure due to steep, rough, or complex geometries. You’ll see how this approach elevates metrology performance and expands what’s possible in real‑world applications.
The session will feature a focused presentation, a live demonstration of the technique in action, and dedicated time for Q&A to dive deeper into your specific interests.
Join us for this webinar to:
- Learn what makes this technology unique
- Hear about real-world applications for Enhanced Data Capture
- Watch a live demonstration of the technique in action
Presenter: Robert Wang, North American Sales Account Manager (East Coast), Bruker
Robert Wang is a Technical Account Manager at Bruker Nano Surfaces & Metrology, where he leads sales and customer engagement across a wide portfolio of advanced surface‑metrology instruments, including profilometers, tribometers, polishers, ellipsometers, and reflectometers. With deep expertise in white‑light interferometry, stylus metrology, and other precision‑measurement techniques, Robert has assisted many clients across every sector of engineering and research.
He holds both an M.Eng. and B.Eng. in Materials Science and Engineering from Imperial College London, complemented by the Business, Professional, and Entrepreneurial Studies (BPES) program. His technical background spans materials characterization, fracture and failure mechanics, quantum physics, nanomaterials, and advanced alloys and ceramics.
Across engineering, analytics, and commercial roles, Robert is driven by a commitment to developing innovative, science‑based solutions that advance sustainability and contribute to a more resilient future.
Presenter: Nishant Kodan, Applications Specialist, Bruker
Nishant Kodan is an Applications Scientist at Bruker Nano. with a strong foundation in physics and optical metrology. He earned an M.S. in Physics from Rochester Institute of Technology and a B.S. in Physics from Hansraj College, University of Delhi. His NIH‑funded master’s thesis built mathematical models for organelle size control and, in collaboration with biologists, explained nucleolar size regulation in worm cells—work tied to cancer and neurodegenerative disease. Nishant has industry experience at Signify (optics for commercial lighting solutions) and ams‑OSRAM (Silicon based image sensor characterization).
