Inter-Element Correction (IEC): An ICP-OES Workshop
IEC’s are still required by many auditors when running environmental samples on an ICP and can be confusing to set up initially. A brief discussion of interferences present in ICP will be followed by a detailed discussion on the set up and execution of using IEC’s in environmental analysis.
Presenter: Paul Krampitz (Application Scientist, Agilent Technologies, Inc.)
Graduate of Bowling Green State University with a Chemistry Bachelor of Science degree. Twenty – five years of Spectroscopy experience mainly Inductively Coupled Plasma (ICP) Spectroscopy as well as ICP-MS and AAS. Experience also includes X-Ray Fluorescence (ED, WD), Laser Ablation, Inorganic Speciation and Microwave Plasma Spectroscopy. Market Segment expertise includes environmental, petrochemical, metallurgical applications.
