Demonstration of Trace Metals and Electronic Grade Materials Analysis Techniques and Strategies on live Instrumentation.

Agilent Applications Scientists will demonstrate on live 8900 Triple Quad ICPMS and 5900 ICPOES instrumentation, the hardware, MassHunter and ICP Expert software as well as tuning and cleanliness strategies used and recommended in semiconductor facilities to reduce contamination, maximize sensitivity and minimize interferences.

Presenter: Bert Woods (Application Scientist, Agilent Technologies, Inc.)

Joined the Agilent ICP-MS team in 2004, with previous employment in the semiconductor industry with Dominion Semiconductor (IBM/Toshiba) and Micron. Bert is a 1997 Chemistry graduate of Radford University in Virginia and an avid Washington DC Sports fan.

Presenter: Emmett Soffey (ICP-MS Product Specialist, Agilent Technologies, Inc.)

Emmett Soffey is an ICP-MS Product Specialist and has been with HP/Agilent for 30 years. He received his undergraduate degree from Cornell University. Prior to Agilent he worked at Brookhaven National Labs studying acid rain in the Adirondack Mountains of northern NY and then went on to work at a number of commercial analytical labs operating GC and GC/MS. Emmett has been part of the Agilent ICP-MS team since 1995. He has worked on the development of new software tools, discrete sampling devices and the GC-ICP-MS interface. In his spare time Emmett spends time hiking in the beautiful Cascade Mountains of Washington State.

Presenter: Sima Singha, PhD (ICP-OES Application Scientist, Atomic Spectroscopy, Agilent Technologies, Inc.)

Sima has over fifteen years of hands on experience as an applications scientist in the field of atomic spectroscopy. Before joining Agilent in 2017, managed an agricultural chemistry laboratory for the analysis of water, soil, and plant tissue digests using ICP-OES for various EPA methods. She received a Ph.D. degree in Chemistry from the University of Illinois at Chicago with numerous peer-reviewed publications.

Presenter: Chris Conklin (Atomic Spectroscopy Product Specialist, Agilent Technologies, Inc.)

With a degree from the University of Wisconsin – Eau Claire, Chris worked in, and lead, a quality control lab testing fine chemicals ranging from reagent grade to high purity. Over the course of 12 years in that role, Chris has run a variety of atomic elemental instruments and techniques including AA, ICP-OES, and ICP-MS. As a result, he has seen most of the periodic table in its elemental form and overcome the associated interferences. In 2018, Chris brought that knowledge and experience to his current role with Agilent as the Product Specialist for Atomic Spectroscopy supporting AA, MP-AES, and ICP-OES for the Eastern US.