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How to Minimize Contamination and Carry Over Issues on ICP-MS

RECORD | Already taken place Su, 1.1.2023
Sources of common lab contaminants in ICP-MS and methods used for their elimination.
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Agilent Technologies: How to Minimize Contamination and Carry Over Issues on ICP-MS
Agilent Technologies: How to Minimize Contamination and Carry Over Issues on ICP-MS

Techniques and tools for improved wash out of “sticky” elements, such as B, Tl, and Hg, on an Agilent ICP-MS will be discussed.

An understanding where the individual elements stick in the instrument aids in the chemistry and the sequence of rinse solutions used for their removal. Use of the Pre-emptive rinse and Intelligent Rinse features within the MassHunter software greatly improve washout of these sticky elements. Features and setup of an Integrated Sample Introduction System (ISIS) also reduce carry over of these elements. Eliminating contamination increases the probability that accurate sample results can be obtained. Sources of common lab contaminants and methods used for their elimination will also be discussed. A semi-Cool plasma technique may be discussed to demonstrate how to calibrate and obtain somewhat lower levels of alkali metals in the presence of their interferences.

Presenter: Ana García-González (Atomic Spectroscopy Application Scientist, Agilent Technologies)

Ana Garcia is the Atomic Spectroscopy Application Scientist at Agilent Technologies. Ana has a broad background in atomic spectroscopy technologies, including international experience developing and validating analytical spectroscopy methods for the geochemical industry. She has also published in the fields of molecular spectroscopy and chemometrics. Ana holds a MSc in plant Biotechnology at CINVESTAV, México, and a Bachelor of Science in Biotechnology Engineering.

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