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Novel Advancements in Trace Level Determination and Longterm Stability of Metals in TMAH and UPW matrices

RECORD | Already taken place Tu, 16.4.2024
Novel Advancements in Trace Level Determination and Longterm Stability of Metals in TMAH and UPW matrices.
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Agilent: Agilent Webinar Series - Semiconductor and Specialty Chemical Industry

Agilent: Agilent Webinar Series - Semiconductor and Specialty Chemical Industry

Novel Advancements in Trace Level Determination and Longterm Stability of Metals in TMAH and UPW matrices.

Presenter: Bert Woods (Application Scientist, Agilent Technologies, Inc.)

Joined the Agilent ICP-MS team in 2004, with previous employment in the semiconductor industry with Dominion Semiconductor (IBM/Toshiba) and Micron. Bert is a 1997 Chemistry graduate of Radford University in Virginia and an avid Washington DC Sports fan.

Agilent Technologies
 

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