Angular Linearity and Resolution on Theta Probe
Applications | 2008 | Thermo Fisher ScientificInstrumentation
Angle‐resolved X‐ray photoelectron spectroscopy (ARXPS) is a powerful technique for probing the chemical composition of material surfaces and thin films. Accurate angular measurements are essential for depth profiling and quantitative surface analysis, affecting applications in catalysis, corrosion, semiconductor manufacture and thin‐film quality control.
This study evaluates the angular linearity and resolution of the Thermo Scientific Theta Probe when operated in its angle‐resolving mode. The goal is to confirm that the instrument’s angular response follows the expected cosine distribution and to quantify its ability to discriminate small angular changes using a calibration ladder.
A smooth silver sample was illuminated by a 500 eV electron beam from a flood gun. Elastically scattered electrons were collected by the Theta Probe’s two‐dimensional detector, which records kinetic energy in one axis and emission angle across 96 discrete channels in the other. Initial measurements determined the angular intensity profile without obstruction, then repeated with a precision calibration ladder placed against the lens.
Unobstructed measurements matched the theoretical cos θ dependence of emitted electron intensity, confirming correct angular response. With the calibration ladder in place, four transmission bands and three blocked regions were observed, each spanning 8.57°. Plotting the measured 50 % transmission angles against the ladder geometry showed excellent linearity across the full range. Angular resolution, defined by the 20 %–80 % signal transition at each step, was consistently below 1.6°, with a mean of < 1.3°. This indicates that the instrument optics, rather than the detector channel width (60°/96≈0.625°), limit resolution.
Advances in electron optics and detector technology may further enhance angular resolution and dynamic range. Integrating automated calibration routines and extending accessible angular spans could broaden ARXPS utility in fields such as in situ reaction monitoring, advanced thin‐film characterization, and real‐time industrial process control.
The Thermo Scientific Theta Probe demonstrates excellent angular linearity and sub–1.3° resolution in angle‐resolved mode, validating its performance for precise ARXPS measurements. Its unique simultaneous angle collection without sample tilting enhances efficiency and measurement reliability.
X-ray
IndustriesMaterials Testing
ManufacturerThermo Fisher Scientific
Summary
Significance of the topic
Angle‐resolved X‐ray photoelectron spectroscopy (ARXPS) is a powerful technique for probing the chemical composition of material surfaces and thin films. Accurate angular measurements are essential for depth profiling and quantitative surface analysis, affecting applications in catalysis, corrosion, semiconductor manufacture and thin‐film quality control.
Objectives and study overview
This study evaluates the angular linearity and resolution of the Thermo Scientific Theta Probe when operated in its angle‐resolving mode. The goal is to confirm that the instrument’s angular response follows the expected cosine distribution and to quantify its ability to discriminate small angular changes using a calibration ladder.
Methodology
A smooth silver sample was illuminated by a 500 eV electron beam from a flood gun. Elastically scattered electrons were collected by the Theta Probe’s two‐dimensional detector, which records kinetic energy in one axis and emission angle across 96 discrete channels in the other. Initial measurements determined the angular intensity profile without obstruction, then repeated with a precision calibration ladder placed against the lens.
Instrumentation
- Thermo Scientific Theta Probe in angle‐resolving XPS mode
- Two‐dimensional detector recording angular channels versus electron kinetic energy
- 500 eV flood‐gun electron source
- Calibration ladder defining seven equal angular bands over a 60° range
Main results and discussion
Unobstructed measurements matched the theoretical cos θ dependence of emitted electron intensity, confirming correct angular response. With the calibration ladder in place, four transmission bands and three blocked regions were observed, each spanning 8.57°. Plotting the measured 50 % transmission angles against the ladder geometry showed excellent linearity across the full range. Angular resolution, defined by the 20 %–80 % signal transition at each step, was consistently below 1.6°, with a mean of < 1.3°. This indicates that the instrument optics, rather than the detector channel width (60°/96≈0.625°), limit resolution.
Practical benefits and applications
- Reliable angular calibration ensures accurate depth profiling in ARXPS analyses.
- High angular resolution (< 1.3°) enables fine surface layer discrimination.
- No sample tilting reduces alignment errors and streamlines data acquisition.
Future trends and potential applications
Advances in electron optics and detector technology may further enhance angular resolution and dynamic range. Integrating automated calibration routines and extending accessible angular spans could broaden ARXPS utility in fields such as in situ reaction monitoring, advanced thin‐film characterization, and real‐time industrial process control.
Conclusion
The Thermo Scientific Theta Probe demonstrates excellent angular linearity and sub–1.3° resolution in angle‐resolved mode, validating its performance for precise ARXPS measurements. Its unique simultaneous angle collection without sample tilting enhances efficiency and measurement reliability.
Reference
- Thermo Fisher Scientific, Application Note 31004: Angular Linearity and Resolution on Theta Probe.
- Thermo Fisher Scientific, Technical Document AN31014.
Content was automatically generated from an orignal PDF document using AI and may contain inaccuracies.
Similar PDF
Operation of the Angle Resolving Lens on Theta Probe
2008|Thermo Fisher Scientific|Applications
Application Note: 31003 Key Words • Surface Analysis • Angle Resolving Lens Mode • Electron Trajectories Operation of the Angle Resolving Lens on Theta Probe In its angle resolving mode, Thermo Scientific Theta Probe is operated such that the electron…
Key words
theta, thetalens, lensplane, planeelectrons, electronsangular, angularangle, angledirection, directionprobe, probefocal, focalanalyzer, analyzerenergy, energyposition, positionslit, slitdispersive, dispersiveimage
Theta Probe: Small Spot XPS Spectrometer with Parallel ARXPS Capability
2008|Thermo Fisher Scientific|Brochures and specifications
Application Note: 31055 Theta Probe: Small Spot XPS Spectrometer with Parallel ARXPS Capability Description Key Words • Parallel ARXPS • Surface Analysis • Ultra-thin Films The Thermo Scientific Theta Probe, Figure 1, is a highperformance XPS instrument. Our patented Theta…
Key words
theta, thetathickness, thicknessprobe, probexps, xpsparxps, parxpsgun, gunsample, sampleangle, anglemaps, mapsray, raydepth, depthavantage, avantageturbomolecular, turbomolecularoverlayer, overlayermulti
Angle Resolved XPS
2008|Thermo Fisher Scientific|Applications
Application Note: 31014 Angle Resolved XPS Introduction Key Words • Surface Analysis • Depth Profiles • Thickness Measurement • Relative Depth Plots Using angle resolved XPS (ARXPS), it is possible to characterize ultra-thin films without sputtering. In most cases, ARXPS…
Key words
thickness, thicknessarxps, arxpslayer, layerangle, angleattenuation, attenuationdepth, depthxps, xpsoverlayer, overlayerinelastic, inelasticangles, angleselastic, elasticphotoelectron, photoelectronfrom, fromnear, nearasymmetry
Errors Associated With Thin Film Measurements Using XPS at a Single Angle
2008|Thermo Fisher Scientific|Applications
Application Note: 31016 Key Words • Surface Analysis • Elastic Scattering • Need for Angle Resolved Measurements Errors Associated With Thin Film Measurements Using XPS at a Single Angle Background Single Angle Measurements Thermo Scientific Theta Probe and Theta 300…
Key words
overlayer, overlayerangle, anglethickness, thicknesselastic, elasticmeasurements, measurementsangular, angularscattering, scatteringxps, xpscalculate, calculateelectrons, electronsgeometry, geometryafrica, africasingle, singlenature, naturesuffered