Operation of the Angle Resolving Lens on Theta Probe
Applications | 2008 | Thermo Fisher ScientificInstrumentation
Angle resolved XPS enhances surface analysis by capturing both energy and angular distributions of emitted electrons simultaneously. This dual mapping offers detailed insight into surface composition and structure, crucial for materials science, thin film characterization and nanotechnology.
This application note explains how the Thermo Scientific Theta Probe is configured in angle resolving mode. It outlines the optical analogy for energy and angle dispersion, and describes lens adjustments required to transform emission angles into spatial distributions on a two dimensional detector.
Ultraviolet and X ray photoelectrons are manipulated by a dual lens system and a hemispherical analyzer equipped with a two dimensional detector. Key elements include
By setting Lens 2 focal lengths to image sample position in the energy dispersive plane and sample emission angle in the orthogonal plane, the Theta Probe generates a 2D map. One axis correlates with kinetic energy, the other with emission angle up to 30 degrees. Ray tracing confirms that energy and angular information are decoupled, yielding precise contour images of surface electronic states.
This technique allows simultaneous acquisition of energy spectra and angular distributions without sample rotation. Benefits include
Advances may include integration with in situ environmental analysis, automated data processing using machine learning for pattern recognition, and extension to time resolved angle resolved spectroscopy. Improved lens designs could further expand angular acceptance and energy resolution.
The angle resolving mode on the Theta Probe leverages a specialized quadrupole lens and hemispherical analyzer to produce combined energy and angular dispersion. This approach enhances surface characterization by mapping electronic states in both dimensions simultaneously.
Thermo Fisher Scientific Application Note 31003, Operation of the Angle Resolving Lens on Theta Probe
X-ray
IndustriesMaterials Testing
ManufacturerThermo Fisher Scientific
Summary
Significance of the Topic
Angle resolved XPS enhances surface analysis by capturing both energy and angular distributions of emitted electrons simultaneously. This dual mapping offers detailed insight into surface composition and structure, crucial for materials science, thin film characterization and nanotechnology.
Objectives and Study Overview
This application note explains how the Thermo Scientific Theta Probe is configured in angle resolving mode. It outlines the optical analogy for energy and angle dispersion, and describes lens adjustments required to transform emission angles into spatial distributions on a two dimensional detector.
Methodology and Instrumentation
Ultraviolet and X ray photoelectrons are manipulated by a dual lens system and a hemispherical analyzer equipped with a two dimensional detector. Key elements include
- Lens 1 with large aperture (60 degree acceptance) and high magnification (4x) to collect wide angular range while minimizing beam divergence into Lens 2
- Quadrupole Lens 2 providing independent focal lengths in orthogonal planes to achieve energy dispersion in one axis and angular dispersion in the other
- Hemispherical analyzer acting as both energy filter and focusing device delivering mirrored angle position at the detector exit plane
Key Results and Discussion
By setting Lens 2 focal lengths to image sample position in the energy dispersive plane and sample emission angle in the orthogonal plane, the Theta Probe generates a 2D map. One axis correlates with kinetic energy, the other with emission angle up to 30 degrees. Ray tracing confirms that energy and angular information are decoupled, yielding precise contour images of surface electronic states.
Benefits and Practical Applications
This technique allows simultaneous acquisition of energy spectra and angular distributions without sample rotation. Benefits include
- Accelerated data collection
- Enhanced surface sensitivity and angular resolution
- Capability to study surface texture, molecular orientation and thin film layering
Future Trends and Opportunities
Advances may include integration with in situ environmental analysis, automated data processing using machine learning for pattern recognition, and extension to time resolved angle resolved spectroscopy. Improved lens designs could further expand angular acceptance and energy resolution.
Conclusion
The angle resolving mode on the Theta Probe leverages a specialized quadrupole lens and hemispherical analyzer to produce combined energy and angular dispersion. This approach enhances surface characterization by mapping electronic states in both dimensions simultaneously.
References
Thermo Fisher Scientific Application Note 31003, Operation of the Angle Resolving Lens on Theta Probe
Content was automatically generated from an orignal PDF document using AI and may contain inaccuracies.
Similar PDF
Theta Probe: Small Spot XPS Spectrometer with Parallel ARXPS Capability
2008|Thermo Fisher Scientific|Brochures and specifications
Application Note: 31055 Theta Probe: Small Spot XPS Spectrometer with Parallel ARXPS Capability Description Key Words • Parallel ARXPS • Surface Analysis • Ultra-thin Films The Thermo Scientific Theta Probe, Figure 1, is a highperformance XPS instrument. Our patented Theta…
Key words
theta, thetathickness, thicknessprobe, probexps, xpsparxps, parxpsgun, gunsample, sampleangle, anglemaps, mapsray, raydepth, depthavantage, avantageturbomolecular, turbomolecularoverlayer, overlayermulti
Angular Linearity and Resolution on Theta Probe
2008|Thermo Fisher Scientific|Applications
Application Note: 31004 Key Words • Surface Analysis • Angle Calibration • Angular Linearity • Angular Resolution Angular Linearity and Resolution on Theta Probe The unique feature of Thermo Scientific Theta Probe is its ability to make angle resolved XPS…
Key words
angular, angularelectrons, electronstheta, thetaangle, angleladder, ladderresolution, resolutionlinearity, linearityelectron, electronprobe, probeafrica, africaitotal, itotalcosθ, cosθelastically, elasticallyits, itssignal
Angle Resolved XPS
2008|Thermo Fisher Scientific|Applications
Application Note: 31014 Angle Resolved XPS Introduction Key Words • Surface Analysis • Depth Profiles • Thickness Measurement • Relative Depth Plots Using angle resolved XPS (ARXPS), it is possible to characterize ultra-thin films without sputtering. In most cases, ARXPS…
Key words
thickness, thicknessarxps, arxpslayer, layerangle, angleattenuation, attenuationdepth, depthxps, xpsoverlayer, overlayerinelastic, inelasticangles, angleselastic, elasticphotoelectron, photoelectronfrom, fromnear, nearasymmetry
The Karlsruhe Micro Nose, KAMINA
2008|Thermo Fisher Scientific|Applications
Application Note: 31052 Key Words • Surface Analysis • ARXPS at Each Point on Linescan • Automated Small Area Analysis • Routine Measurement of Thin Films • Measurement of Large Samples The Karlsruhe Micro Nose, KAMINA The growing demand for…
Key words
arxps, arxpstheta, thetaangle, anglethickness, thicknesssensor, sensorxps, xpsresolved, resolvedmicro, microdevice, deviceafrica, africacompensation, compensationkamina, kaminasilicon, siliconsubstrate, substrategraticule