Automated Multipurpose Powder X-Ray Diffractometer

Importance of the Topic

Pounder X-ray diffraction remains a cornerstone technique for material characterization, providing critical insights into phase composition, crystal structure, and microstructure. Advances in automation, speed, and data quality are key to meeting growing demands across research, quality control, and industrial production.

Objectives and Overview of the Article

This article introduces the XRDynamic 500, an automated multipurpose powder X-ray diffractometer that redefines performance benchmarks by combining high speed, superior resolution, and broad application flexibility. The goal is to demonstrate how the TruBeam concept drives improved measurement efficiency and data quality without compromise.

Methodology

The XRDynamic 500 is built around the TruBeam concept, which integrates a large goniometer radius (360 or 400 mm) and a fully evacuated beam path. Automated routines ensure precise alignment of optics, beam geometry switching between three configurations, and sample positioning. This architecture maintains maximal signal-to-noise ratios and delivers resolutions 20 percent sharper than conventional Bragg-Brentano setups.

Used Instrumentation

• Primux 3000 sealed-tube X-ray source with line or point focus, supporting automatic recognition and quick tube exchange
• High-precision X-ray optics from AXO Dresden, including mirrors and monochromators integrated in an automated optics unit
• Pixos pixel detectors (Si and CdTe sensors, Timepix3 chip) for 0D and 1D detection modes with quantum efficiencies exceeding 97 percent
• Vertical theta-theta goniometer with strain wave gearing, angular range up to 162.5 degrees, minimum step size of 0.0001 degrees, and linearity better than 0.01 degrees
• Sample stages for ambient, non-ambient, SAXS, PDF, capillary, and automated sample handling
• XRDdrive for instrument control and automated experiment setup, and XRDanalysis for qualitative and quantitative phase evaluation and Rietveld refinement

Main Results and Discussion

Testing shows the XRDynamic 500 delivers exceptional data quality across multiple applications: powder phase identification and quantification by Rietveld analysis, non-ambient diffraction with integrated control of temperature and atmosphere, small-angle X-ray scattering with a minimum q of 0.05 nm1, and pair distribution function analysis using Mo or Ag sources. Resolution of 0.021 degrees FWHM on LaB6 and rapid beam geometry changes confirm the system’s versatility.

Benefits and Practical Applications

• Fully automated alignment and geometry switching reduce setup time and operator error
• High-resolution data enable precise crystal and microstructure analysis across materials such as minerals, pharmaceuticals, alloys, and nanomaterials
• Integrated non-ambient functionality supports in situ studies under variable temperature, pressure, and gas environment
• SAXS and PDF capabilities on the same platform expand the range of structural investigations from nanoscale to amorphous systems

Future Trends and Potential Applications

Emerging trends include real-time in situ monitoring of dynamic processes, integration with machine-learning algorithms for automated phase identification, expanded non-ambient attachment options for extreme conditions, and further miniaturization of sample environments. Coupling with complementary spectroscopic and imaging techniques will enhance multidimensional material analysis.

Conclusion

The XRDynamic 500 sets a new standard in powder X-ray diffraction by merging high measurement speed, superior resolution, and seamless automation within a single platform. Its versatility across ambient, non-ambient, SAXS, and PDF applications makes it a powerful tool for both research and industrial laboratories.