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Particle Characterization

Brochures and specifications | 2018 | Anton PaarInstrumentation
Particle characterization, Particle size analysis, Rheometry, Laboratory instruments
Industries
Other
Manufacturer
Anton Paar

Summary

Importance of the Topic


Particle characterization underpins advances in materials science, pharmaceuticals, catalysis and quality control across industries. Understanding particle size, shape, density, porosity and surface properties is critical to predict performance, optimize processes and ensure product consistency. A comprehensive analytical portfolio enables researchers and engineers to link microscopic particle attributes to macroscopic behavior, driving innovation and process efficiency.

Objectives and Article Overview


This article presents Anton Paar’s broadest offering in particle analysis, highlighting a suite of 29 instruments covering more than a dozen parameters. It aims to guide users through instrument selection, technology principles and application areas, emphasizing the benefits of integrated workflows and advanced data interpretation.

Methodology and Instrumentation


Key measurement techniques and instruments include
  • Particle Size Analysis via dynamic light scattering (Litesizer series) and laser diffraction (PSA series) for nanometer to millimeter ranges, with options for zeta potential, refractive index and automated sample handling
  • Solid Density Analysis using gas pycnometry for true and skeletal density, tapped bulk and geometric density determination
  • Porosity Measurement through mercury intrusion porosimetry (PoreMaster) offering automated mercury filling, oil purging and high-pressure control
  • Powder Rheology on MCR Evolution-based systems for flow behavior, segregation testing and fluidized bed characterization
  • Adsorption Analysis with instruments for vapor sorption, physisorption and chemisorption, employing world-renowned data models and multi-station automation
  • X-Ray Diffraction (XRDynamic 500) featuring large goniometer radius, evacuated beam path, full automation of optics, and self-alignment capabilities
  • Small-Angle X-Ray Scattering (SAXSpace, SAXSpoint 5.0) with high-flux sources, hybrid photon-counting detectors and variable environment stages

Results and Discussion


Each technique delivers high accuracy, reproducibility and operational safety. Dynamic light scattering and laser diffraction enable rapid particle size distribution analysis with minimal sample preparation. Gas pycnometry and mercury intrusion porosimetry yield precise density and pore size distributions. Powder rheology systems achieve consistent flow metrics, reducing manual variability. Advanced XRD and SAXS platforms provide superior signal-to-noise ratios, versatile application scopes and efficient throughput. Integrated software suites streamline data acquisition and interpretation, minimizing operator intervention.

Benefits and Practical Applications


• Improved process understanding and material design through reliable particle metrics
• Enhanced product quality and reduced batch failures in pharmaceuticals and fine chemicals
• Optimized catalyst development via precise surface area and pore structure analysis
• Scalable workflows for R&D, QA/QC and industrial production environments

Future Trends and Opportunities


Emerging directions include combining complementary techniques for multimodal particle profiling, inline and at-line process monitoring, machine learning-driven data analysis and miniaturization of sensors for field applications. Further automation and integration will expedite sample-to-report workflows, enabling real-time decision making in manufacturing and research settings.

Conclusion


Anton Paar’s extensive particle characterization portfolio addresses diverse analytical needs across industries. By leveraging cutting-edge instrumentation and software, users can achieve deeper insights into particle attributes, driving innovation, ensuring quality and improving process efficiency.

Reference


Anton Paar GmbH New horizons in particle analysis XPAIP056EN-D 2018

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