Electronics & Chemicals - Application Notebook

Importance of Advanced Analytical Techniques in Electronics & Chemical Industries

Modern electronics, chemical manufacturing, environmental monitoring, and quality control demand rapid, precise, and versatile analytical methods. From screening regulated substances in polymer materials to evaluating trace contaminants in food, water, and industrial products, these techniques support safety regulations, product development, defect analysis, and environmental protection.

Objectives and Overview of Collected Case Studies

This collection presents diverse case studies demonstrating how specialized analytical methods—such as pyrolysis‐GC/MS, headspace‐GC with barrier discharge ionization detector, gas chromatography–mass spectrometry (GC‐MS), energy‐dispersive X‐ray fluorescence (EDXRF), FTIR spectroscopy, UV‐Vis‐NIR spectrophotometry, and infrared microscopy—address real‐world challenges in electronics, chemicals, food safety, and materials science. Each study illustrates workflows from sample preparation and instrumental configuration to data acquisition and interpretation.

Applied Methodologies and Instrumentation

• Pyrolysis‐GC/MS (Py‐GC/MS): Screening of phthalate esters, brominated flame retardants, and other additives in polymers using a multishot pyrolyzer coupled to a GCMS-QP series instrument. High‐speed Scan/SIM modes and one‐button “Py‐Screener” packages facilitated rapid, solvent-free screening and quantitation.
• Headspace GC with BID Detector: Direct, derivatization‐free analysis of volatile aldehydes (formaldehyde to butyraldehyde) in water using a headspace sampler and a gas chromatograph with barrier discharge ionization.
• GC‐MS of Organic Solvents and VOCs: Simultaneous analysis of 58 workplace solvents and hazardous chemicals using dual columns or twin‐line MS configurations for robust quantitation and high throughput.
• Purge‐and‐Trap GC/MS: Trace analysis of volatile organic compounds in leachates from water supply equipment and automotive interior materials for compliance with health and automotive standards.
• Pyrolysis and EGA/MS: Monitoring UV‐induced degradation products of encapsulants (e.g., EVA) and evaluating thermal stability of polymer materials by evolved gas analysis and infrared spectroscopy.
• FTIR Spectroscopy and Microscopy: Identification of surface contaminants, fingerprinting of polymers and additives by ATR and transmission modes, and rapid‐scan monitoring of chemical adsorption processes on catalysts and nanomaterials.
• X‐ray Fluorescence (EDXRF): Non‐destructive quantitation of heavy metals (As, Pb) in dietary supplements, alloy compositions (bismuth bronze), and screening of environmental contaminants. Overlap and profile corrections ensure accuracy for trace elements in complex matrices.
• Infrared Microscopy (AIM-9000, SurveyIR): Analysis of sub‐100 μm samples, cross‐sections of biological tissues (e.g., human hair), multilayer films, and nanocellulose dispersions using microbeam lenses, micro sample holders, and mapping software for spatially resolved chemical imaging.
• UV‐Vis‐NIR Spectrophotometry with Integrating Spheres: Measurement of solar transmittance/reflectance of window glazes, thermal films, and building materials at variable incident angles; evaluation of light‐scattering samples with minimized detector switching artifacts using large‐diameter spheres.

Main Results and Discussion

The studies revealed that solvent‐free pyrolysis screening accurately quantifies regulated additives at sub‐percent levels, headspace‐GC/BID achieves sub‐ppm sensitivity for aldehydes, and twin‐line GC‐MS supports rapid solvent panels for workplace safety. FTIR ATR and microscopy provide direct in situ contaminant identification and mapping of chemical modifications such as cysteic acid formation in UV/chemical‐treated hair. EDXRF with overlap correction delivers reliable trace metal quantitation without wet chemistry. UV‐Vis spectrophotometry with large integrating spheres ensures consistent transmittance/reflectance measurements for light‐scattering materials across broad wavelengths and incident angles.

Benefits and Practical Applications of the Methods

• Regulatory Compliance: Rapid screening of RoHS substances and food safety analytes with minimal sample prep.
• Quality Control: Non‐destructive analysis of contaminants, coatings, and multilayer films for defect prevention.
• Research & Development: Real‐time monitoring of surface interactions and degradation mechanisms in catalysts and polymers.
• Industrial Analytics: High throughput GC‐MS and XRF workflows for solvent panels, trace metals, and additive profiling.
• Spatially Resolved Chemistry: Infrared and X‐ray microscopy enabling chemical imaging at micro‐ to nanoscale.
• Energy and Construction Materials: Measurement of solar control films and building materials for thermal insulation and daylighting design.

Future Trends and Potential Applications

Integration of automated sample handling, machine learning–driven spectral analysis, and multimodal instrumentation (e.g., combined GC/MS‐FTIR or EDX‐FTIR platforms) will streamline contaminant identifications and accelerate failure analysis. Advances in detector technology and miniaturized sampling accessories will further extend spatial resolution and sensitivity for single‐cell analyses, nanoparticle characterization, and on‐line process monitoring. In energy materials research, real‐time spectroscopic mapping under environmental stress will drive the development of next‐generation photovoltaic, lighting, and thermal control systems.

Conclusion

A broad array of advanced analytical techniques—covering pyrolysis GC/MS, headspace GC/BID, GC/MS, EGA/MS, FTIR spectroscopy, infrared microscopy, XRF, and UV‐Vis spectrophotometry—demonstrate powerful capabilities for rapid, sensitive, and spatially resolved analysis across electronics, chemical, environmental, and materials science applications. These methods enhance regulatory compliance, quality assurance, and research innovation by offering solvent‐free screening, non‐destructive contaminant identification, and detailed chemical imaging at the micro‐ and nanoscale.

References

• Shimadzu Application Data Sheets and Application Notes (2014–2018).
• Directive 2002/95/EC (RoHS), Public Law 110–314 (CPSIA), Directive 2005/84/EC.
• ISO and JIS standards for optical measurements (e.g., ISO 13468-2).
• K. Ochi, H. Nakamura, S. Watanabe, Adv. X-Ray Chem. Anal. 38 (2007) 191.