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Agilent 5110 ICP-OES Specifications

Brochures and specifications | 2016 | Agilent TechnologiesInstrumentation
ICP-OES
Industries
Manufacturer
Agilent Technologies

Summary

Significance of the Topic


Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES) is a widely adopted analytical technique for multi-elemental determination in environmental, industrial, pharmaceutical and research laboratories. Its capacity for high throughput, broad dynamic range and robust performance makes it essential for quality control, compliance testing and advanced research.

Objectives and Study Overview


This whitepaper presents the design and performance characteristics of the Agilent 5110 ICP-OES system. Its goal is to illustrate how innovative hardware and software features combine to deliver faster sample analysis, lower gas consumption and uncompromised precision across challenging matrices. The document compares different viewing modes (radial, axial, vertical dual view and synchronous vertical dual view) and outlines their benefits for various applications.

Instrumentation Used


  • Sample introduction: One-piece quartz vertical torch with auto-alignment; interchangeable nebulizers and spray chambers for organic, high-matrix and HF applications
  • Gas control: Three modular gas control units (single, two-port, three-port) with high-precision mass flow controllers for plasma, auxiliary, nebulizer and option gas flows
  • RF generator: 27 MHz solid-state, water-cooled, 700–1500 W output with rapid response to matrix changes
  • Optical system: Vertical dual view pre-optics with Dichroic Spectral Combiner for simultaneous axial and radial measurement; 400 mm focal length thermostatted polychromator with CaF₂ prism and echelle grating
  • Detector: VistaChip II CCD, cooled to –40 °C, full 167–785 nm coverage, Adaptive Integration Technology for simultaneous trace and intense signal measurement
  • Software: ICP Expert v7 with application-specific applets, background correction options, Fast Automated Curve-fitting; optional Pro pack for 21 CFR Part 11 compliance, autosampler control and live data export

Main Results and Discussion


Performance testing demonstrates warm-up times under 20 minutes, signal stability below 1% RSD over eight hours, stray light below 2 ppm As (188.980 nm) and typical spectral resolution of <10 pm for key lines. Synchronous Vertical Dual View delivers four modes in a single instrument, halving analysis time and gas usage. The robust vertical torch and solid-state RF generator enable reliable operation with high matrix and organic samples.

Benefits and Practical Applications


  • High throughput: Rapid multi-mode analysis without method redeployment
  • Cost savings: Reduced argon consumption and maintenance
  • Versatility: Seamless transition between radial, axial and dual-view measurements
  • Ease of use: Automated torch alignment, application applets and self-diagnostics

Future Trends and Applications


Emerging developments may include further automation with machine-learning-driven method optimization, enhanced detector technologies for lower detection limits, miniaturized ICP designs for field deployment and integrated online monitoring solutions for process control.

Conclusion


The Agilent 5110 ICP-OES represents a significant advance in elemental analysis, combining speed, sensitivity and robustness in a flexible platform. Its innovative hardware and software features fulfill the evolving demands of modern laboratories.

Reference


  • Agilent Technologies (2016). Agilent 5110 ICP-OES Specifications. Publication No. 5991-6875EN.

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