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Agilent ICP-MS Interface Cones

Technical notes | 2019 | Agilent TechnologiesInstrumentation
ICP/MS, ICP/MS/MS
Industries
Manufacturer
Agilent Technologies

Summary

Importance of the Topic


The interface cones in an ICP-MS system form the critical vacuum boundary that samples ions from the plasma and delivers them into the mass spectrometer. High-precision cone geometry, material purity and stable operating temperature are essential to achieve low detection limits, accurate quantification and long-term signal stability. In routine applications across environmental, clinical, industrial or geochemical analyses, inferior cones can lead to poor sensitivity, elevated backgrounds, signal drift, frequent maintenance and higher operating costs.

Objectives and Study Overview


This study compares genuine Agilent nickel (Ni) sampling and skimmer cones for the Agilent 7900 ICP-MS against cones sourced from four third-party suppliers. Key performance metrics include packaging and handling, physical dimensions and weight, sensitivity, background equivalent concentration (BEC), detection limits, oxide and doubly charged ratios, short- and long-term stability, and ease of use.

Methodology


A production Agilent 7900 quadrupole ICP-MS with x-lens was used for all tests under standard low-matrix plasma conditions. Multiple cone pairs from each supplier were measured “as received” and after a two-step conditioning protocol (30 min in 10% interference check solution, 10 min 5% HNO3 rinse). Performance criteria were based on Agilent factory specifications for sensitivity (Mcps/ppm), background (cps), detection limits (ppt), oxide ratio (% CeO/Ce), doubly charged ratio (% Ce2+/Ce+), and stability (%RSD over 20 min and 2 h).

Instrumentation Used


  • Agilent 7900 ICP-MS system with octopole reaction system (ORS)
  • x-lens ion extraction assembly
  • Standard sample introduction (nebulizer, spray chamber, peristaltic pump)
  • Agilent interference check solution and ultrapure water

Key Results and Discussion


Agilent cones consistently met or exceeded all specifications. Third-party cones showed:
  • Packaging shortcomings (lack of tamper seal, no desiccant, risk of damage during storage/shipment)
  • Weight and dimensional variances leading to mismatched operating temperatures and reduced ion transmission
  • Lower sensitivity by 20–60% across the mass range, both before and after conditioning
  • Higher BECs and degraded detection limits, especially at mid- and high masses
  • Oxide ratio failures in some sets, indicating potential interference removal issues
  • Poor long-term stability, with signal drift up to 30% over two hours for some suppliers

Benefits and Practical Applications


Using genuine Agilent interface cones ensures:
  • Optimal sensitivity and lowest detection limits for trace elements
  • Stable backgrounds and minimal spectral interferences
  • Reliable short- and long-term signal stability, reducing QC failures and reruns
  • Durable cones with predictable lifetime and simplified maintenance
  • Clear handling instructions, ID labeling and packaging for inventory control

Future Trends and Applications


Advances in cone materials (e.g., platinum tips), precision manufacturing, and surface coatings may further extend cone lifetimes and improve matrix tolerance. Integration of automated diagnostics, predictive maintenance using machine learning, and sustainable recycling programs for precious metal cones are expected to enhance productivity and reduce laboratory costs. Continued development of collision/reaction cell technology and software-driven tuning will also optimize interference removal and simplify method development.

Conclusion


High-quality interface cones are vital to the performance of ICP-MS instruments. Genuine Agilent Ni sampling and skimmer cones demonstrate superior manufacturing consistency, analytical performance and operational reliability compared to non-Agilent alternatives. Adopting Agilent interface cones maximizes sensitivity, minimizes background and downtime, and ensures cost-effective long-term operation.

References


No external references were provided in the original document.

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