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Molecular Spectroscopy Application eHandbook
2017|Agilent Technologies|Guides
HomePreviousNextTABLE OF CONTENTSCOATING CHALLENGESINSTRUMENT OVERVIEW+ MEASUREMENTS OF COATINGSOTHER COATING TECHNOLOGIESGATHER RICH INSIGHTS FROMCOATINGS ANALYSISMolecular Spectroscopy Application eHandbook HomePreviousNextTABLE OF CONTENTSCOATING CHALLENGESINSTRUMENT OVERVIEW+ MEASUREMENTS OF COATINGSOTHER COATING TECHNOLOGIESTABLE OF CONTENTSClick the links to jump immediately to that sectionCOATING CHALLENGES3UV-VIS-NIR MEASUREMENTS79INSTRUMENT OVERVIEW8Automated spectrophotometric...
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Agilent Cary 7000 universal measurement spectrophotometer
2022|Agilent Technologies|Brochures and specifications
Advance Your MaterialsAgilent Cary 7000 universal measurement spectrophotometer A More Powerful Approach toMeasuring Solid SamplesDo you measure the opticalproperties of coatings, thinfilms, optical components,solar cells, or glass?Do you measure reflectanceAND transmission?Do you want to reduceyour cost-per-analysis, andsave time and money?Do you...
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Applications of UV-Vis-NIROptical Characterization ofMaterials Using SpectroscopyApplication Compendium > Return to table of contentsTable of contentsIntroduction 4Optics 5Characterizing Sub-Nanometer Narrow Bandpass Filters Evaluation of the Cary Specular Reflectance Accessory for theMeasurement of Optical Constants of Thin FilmsGaining Deeper Insights into Thin...
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Application NoteMaterials testingand researchSpectrophotometric Spatial Profilingof Coated Optical WafersEfficient handling of large samples and multipleUV-Vis-NIR reflectance measurements using fullyautomated sample handlingAuthorTravis BurtFabian ZieschangAgilent Technologies, Inc.Parts of this workwere published in:Burt, T.; Zieschang, F.Optical Coating Uniformityof 200 mm (8’’) DiameterPrecut Wafers....
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