Spectrophotometric Spatial Profiling of Coated Optical Wafers
Applications | 2020 | Agilent TechnologiesInstrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
IndustriesMaterials Testing
ManufacturerAgilent Technologies
Key wordswafer, reflection, optical, polarization, incidence, coating, autosampler, incident, angle, uma, beam, angles, patch, mapping, aperture, uniformity, averaging, range, could, center, bandwidth, interference, wavelength, reflectance, sample, spatial, characterization, measurements, nir, interval, solids, individual, centrosymmetric, zto, oic, coated, measurement, vis, holder, automated, profiles, obstruct, correction, large, multiple, fabian, zieschang, profiling, travis, ums
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