Library | LabRulez ICPMS

Ultrapure Process Chemicals Analysis by ICP-QQQ with Hot Plasma Conditions

Applications

| 2021 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Analysis of Ultratrace Impurities in High Silicon Matrix Samples by ICP-QQQ

Applications

| 2021 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Quantifying Metal Impurities in Li-Ion Battery Raw Materials by ICP-MS/MS

Applications

| 2022 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals

WCPS: Direct Metal Analysis by New Galvano-Mirror fs-LA-ICP-MS using 100%-Normalization Method with NIST 612 Glass CRM as Calibration Standard

Posters

| 2023 | Agilent Technologies

ICP/MS, ICP/MS/MS, Laser ablation

Instrumentation

ICP/MS, ICP/MS/MS, Laser ablation

Manufacturer

Agilent Technologies

Industries

Elemental and Particle Analysis of N-Methyl-2-Pyrrolidone (NMP) by ICP-MS/MS

Applications

| 2022 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

High Throughput, Direct Analysis of Seawater using the Agilent 7800 ICP-MS with HMI for Aerosol Dilution

Applications

| 2017 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Environmental

Direct Analysis of Trace Metal Impurities in High Purity Nitric Acid Using ICP-QQQ

Applications

| 2018 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Determination of Ultratrace Impurities in Semiconductor Photoresist Using ICP-MS/MS

Applications

| 2023 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Automated Surface Analysis of Metal Contaminants in Silicon Wafers by Online VPD-ICP-MS/MS

Applications

| 2023 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Analysis of Metallic Impurities in Specialty Semiconductor Gases Using Gas Exchange Device (GED)-ICP-MS

Applications

| 2022 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Ultrapure Process Chemicals Analysis by ICP-QQQ with Hot Plasma Conditions

Analysis of Ultratrace Impurities in High Silicon Matrix Samples by ICP-QQQ

Quantifying Metal Impurities in Li-Ion Battery Raw Materials by ICP-MS/MS

WCPS: Direct Metal Analysis by New Galvano-Mirror fs-LA-ICP-MS using 100%-Normalization Method with NIST 612 Glass CRM as Calibration Standard

Elemental and Particle Analysis of N-Methyl-2-Pyrrolidone (NMP) by ICP-MS/MS

High Throughput, Direct Analysis of Seawater using the Agilent 7800 ICP-MS with HMI for Aerosol Dilution

Direct Analysis of Trace Metal Impurities in High Purity Nitric Acid Using ICP-QQQ

Determination of Ultratrace Impurities in Semiconductor Photoresist Using ICP-MS/MS

Automated Surface Analysis of Metal Contaminants in Silicon Wafers by Online VPD-ICP-MS/MS

Analysis of Metallic Impurities in Specialty Semiconductor Gases Using Gas Exchange Device (GED)-ICP-MS

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