ICPMS
Menu
More information
WebinarsAbout usContact usTerms of use
LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike
Language Čeština

    1. Databases

    1. Industries

    1. Instrumentation

    1. Manufacturer

    1. Author

    1. Content Type

    1. Publication Date

    Direct Measurement of Metallic Impurities in 20% Ammonium Hydroxide by 7700s/7900 ICP-MS

    Applications
    | 2017 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Measuring the Optical Properties of Photovoltaic Cells

    Applications
    | 2023 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Determination of Organic Contaminants in Sulfuric Acid using Wet Oxidation Type Total Organic Carbon Analyzer

    Applications
    | 2018 | Shimadzu
    TOC
    Instrumentation
    TOC
    Manufacturer
    Shimadzu
    Industries
    Energy & Chemicals

    Direct Analysis of Photoresist and Related Solvents Using the Agilent 7500cs ICP-MS

    Applications
    | 2004 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    WCPS: Ultratrace Analysis of Phosphorus, Boron and Other Impurities in Photovoltaic Silicon and Trichlorosilane by ICP-MS with High Energy Collision Cell

    Posters
    | 2011 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Ultrapure Process Chemicals Analysis by ICP-QQQ with Hot Plasma Conditions

    Applications
    | 2021 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    WCPS: The Analysis and Stability of High Purity TetraMethylAm m onium Hyrdoxide (TMAH) with the Agilent 8900 QQQ-ICPMS

    Posters
    | 2018 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Measurement of Transmittance Distribution Map of Sample Plane

    Technical notes
    | N/A | Shimadzu
    UV–VIS spectrophotometry
    Instrumentation
    UV–VIS spectrophotometry
    Manufacturer
    Shimadzu
    Industries

    Using ICP-MS/MS with M-Lens for the analysis of high silicon matrix samples

    Posters
    | 2020 | Agilent Technologies (ASMS)
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    X-ray photoelectron spectrometer - AXIS Nova

    Brochures and specifications
    | 2018 | Shimadzu
    X-ray
    Instrumentation
    X-ray
    Manufacturer
    Shimadzu
    Industries
    Others
     

    Related content

    ‌

    IOCB Tech has opened Pharmtheon, a high-tech center for new medicines in Prague

    Th, 16.5.2024
    Ústav organické chemie a biochemie AV ČR
    ‌

    LabRulez CAREER section is waiting for you to open

    We, 15.5.2024
    LabRulez
    ‌

    From studies at RECETOX to dream job in Düsseldorf, Germany: Interview with Dr. Eliška Kuchovská

    We, 15.5.2024
    RECETOX - Centrum pro výzkum toxických látek v prostředí
    ‌
    Other projects
    Follow us
    More information
    WebinarsAbout usContact usTerms of use
    LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike