Measuring the UV protection factor (UPF) of fabrics and clothing
Applications
| 2011 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Gaining Deeper Insights into Thin Film Response
Applications
| 2022 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
CCD and CID solid-state detectors
Technical notes
| 2016 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
Industries
The determination of thin film thickness using reflectance spectroscopy
Applications
| 2011 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Micro-Raman Spectroscopy in Thin Section Analysis of Rock Mineralogy
Applications
| 2019 | Metrohm
RAMAN Spectroscopy
Instrumentation
RAMAN Spectroscopy
Manufacturer
Metrohm
Industries
Materials Testing
Analysis of Trace Elements in Water using Ultra Thin Film (1)
Applications
| N/A | Shimadzu
X-ray
Instrumentation
X-ray
Manufacturer
Shimadzu
Industries
Environmental
Analysis of Trace Elements in Water using Ultra Thin Film (2)
Applications
| N/A | Shimadzu
X-ray
Instrumentation
X-ray
Manufacturer
Shimadzu
Industries
Environmental
X-ray Fluorescence Analysis of Lead in Tin Plating Using Theoretical Intensity of Scattered X-rays - Analysis of RoHS Regulated Elements by Energy Dispersive X-ray Fluorescence Spectrometer (EDX)