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    Optical Characterization of Thin Films

    Applications
    | 2022 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Gaining Deeper Insights into Thin Film Response

    Applications
    | 2022 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    The determination of thin film thickness using reflectance spectroscopy

    Applications
    | 2011 | Agilent Technologies
    UV–VIS spectrophotometry
    Instrumentation
    UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Micro-Raman Spectroscopy in Thin Section Analysis of Rock Mineralogy

    Applications
    | 2019 | Metrohm
    RAMAN Spectroscopy
    Instrumentation
    RAMAN Spectroscopy
    Manufacturer
    Metrohm
    Industries
    Materials Testing

    X-ray Fluorescence Analysis of Lead in Tin Plating Using Theoretical Intensity of Scattered X-rays - Analysis of RoHS Regulated Elements by Energy Dispersive X-ray Fluorescence Spectrometer (EDX)

    Applications
    | N/A | Shimadzu
    X-ray
    Instrumentation
    X-ray
    Manufacturer
    Shimadzu
    Industries
    Materials Testing

    Analysis of CIGS Solar Cell by ICPE-9000

    Applications
    | N/A | Shimadzu
    MP/ICP-AES
    Instrumentation
    MP/ICP-AES
    Manufacturer
    Shimadzu
    Industries
    Materials Testing

    Analysis of Trace Elements in Water using Ultra Thin Film (1)

    Applications
    | N/A | Shimadzu
    X-ray
    Instrumentation
    X-ray
    Manufacturer
    Shimadzu
    Industries
    Environmental

    Analysis of Trace Elements in Water using Ultra Thin Film (2)

    Applications
    | N/A | Shimadzu
    X-ray
    Instrumentation
    X-ray
    Manufacturer
    Shimadzu
    Industries
    Environmental

    Determining the effects of angle on the infra-red reflectance properties of thin films in architectural glass using the Agilent Cary 630 FTIR

    Applications
    | 2013 | Agilent Technologies
    FTIR Spectroscopy
    Instrumentation
    FTIR Spectroscopy
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Evaluation of the Cary Absolute Specular Reflectance accessory for the measurement of optical constants of thin films

    Applications
    | 2011 | Agilent Technologies
    UV–VIS spectrophotometry
    Instrumentation
    UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing
     

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