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CARY 630 FTIR COMPONENTS BACKED WITH CONFIDENCE
Others
| 2016 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Monitoring Heavy Metals by ICP- OES for Compliance with RoHS and WEEE Directives
Applications
| 2010 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
Industries
Materials Testing
Lead in lead-free solder – EDX-720
Others
| 2006 | Shimadzu
X-ray
Instrumentation
X-ray
Manufacturer
Shimadzu
Industries
Materials Testing
Determination of hazardous substances according to RoHS
Others
| 2005 | Shimadzu
X-ray
Instrumentation
X-ray
Manufacturer
Shimadzu
Industries
Materials Testing
Low reflectance measurements using the ‘VW’ technique
Technical notes
| 2011 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
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Agilent Technologies
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A Faster, More Accurate Way of Characterizing Cube Beamsplitters
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| 2022 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
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NIR Spectroscopy, UV–VIS spectrophotometry
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Agilent Technologies
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Materials Testing
A Faster, More Accurate Way of Characterizing Cube Beamsplitters
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| 2022 | Agilent Technologies
UV–VIS spectrophotometry
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UV–VIS spectrophotometry
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Agilent Technologies
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Materials Testing
Shimadzu EDX-LE
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| 2017 | Shimadzu
X-ray
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X-ray
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Shimadzu
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The Determination of Hazardous Substances According to RoHS and WEEE Directives
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| N/A | Shimadzu
AAS, X-ray
Instrumentation
AAS, X-ray
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Shimadzu
Industries
Materials Testing
Determination of Ultratrace Impurities in Semiconductor Photoresist Using ICP-MS/MS
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| 2023 | Agilent Technologies
ICP/MS, ICP/MS/MS
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ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
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Semiconductor Analysis
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