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Measurement of Trace Elements in Malt Spirit Beverages (Whisky) by 7500cx ICP-MS
Applications
| 2007 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Food & Agriculture
Direct Elemental Analysis of Gasoline by Agilent 7500ce ORS ICP-MS
Applications
| 2005 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals
Trace Detection of Aspartame in Beverages
Applications
| 2020 | Metrohm
RAMAN Spectroscopy
Instrumentation
RAMAN Spectroscopy
Manufacturer
Metrohm
Industries
Food & Agriculture
Trace elemental analysis of distilled alcoholic beverages using the Agilent 7700x ICP-MS with octopole collision/ reaction cell
Applications
| 2012 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Food & Agriculture
Safety - Carbon dioxide
Technical notes
| 2014 | Air Products
Consumables
Instrumentation
Consumables
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Air Products
Industries
See Through Raman Technology: Expanded capabilities for through package identification using 785 nm and 1064 nm excitation Raman
Technical notes
| 2018 | Metrohm
RAMAN Spectroscopy
Instrumentation
RAMAN Spectroscopy
Manufacturer
Metrohm
Industries
The Agilent Cary 630 FTIR Spectrometer
Others
| 2022 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Clinical Research
APWC: Interference-free Measurement of Trace Mercury in Tungsten-rich Cosmetic Sample using ICP-QQQ
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| 2017 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Others
Safety - Gaseous helium
Technical notes
| 2014 | Air Products
Consumables
Instrumentation
Consumables
Manufacturer
Air Products
Industries
Determination of trace elements in ultrapure semiconductor grade sulfuric acid using the Agilent 8900 ICP-QQQ in MS/MS mode
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| 2018 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
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