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    Agilent ICP-MS Journal (October 2020, Issue 82)

    Others
    | 2020 | Agilent Technologies
    HPLC, ICP/MS, Speciation analysis, ICP/MS/MS
    Instrumentation
    HPLC, ICP/MS, Speciation analysis, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Environmental, Food & Agriculture, Energy & Chemicals , Semiconductor Analysis

    Measurement of Transmittance Distribution Map of Sample Plane

    Technical notes
    | N/A | Shimadzu
    UV–VIS spectrophotometry
    Instrumentation
    UV–VIS spectrophotometry
    Manufacturer
    Shimadzu
    Industries

    Agilent ICP-MS Journal (November 2021, Issue 86)

    Others
    | 2021 | Agilent Technologies
    Ion chromatography, IC-MS, ICP/MS, ICP/MS/MS
    Instrumentation
    Ion chromatography, IC-MS, ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies, Metrohm, CEM
    Industries
    Environmental, Food & Agriculture, Semiconductor Analysis

    Semiconductor workflows - Trace contaminant analysis application compendium

    Guides
    | 2023 | Thermo Fisher Scientific
    Ion chromatography
    Instrumentation
    Ion chromatography
    Manufacturer
    Thermo Fisher Scientific
    Industries
    Semiconductor Analysis

    Spectroelectrochemistry Applications Book

    Guides
    | 2022 | Metrohm
    RAMAN Spectroscopy, NIR Spectroscopy, UV–VIS spectrophotometry, Electrochemistry
    Instrumentation
    RAMAN Spectroscopy, NIR Spectroscopy, UV–VIS spectrophotometry, Electrochemistry
    Manufacturer
    Metrohm
    Industries
    Energy & Chemicals , Materials Testing

    Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

    Applications
    | 2020 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing, Semiconductor Analysis

    Measuring the optical properties of photovoltaic cells using the Agilent Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500

    Applications
    | 2011 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing, Semiconductor Analysis

    Quantitative Analysis of Legacy and Emerging PFAS in Semiconductor Lubricant Using Agilent 6475 Triple Quadrupole LC/MS

    Applications
    | 2024 | Agilent Technologies
    LC/MS, LC/MS/MS, LC/QQQ
    Instrumentation
    LC/MS, LC/MS/MS, LC/QQQ
    Manufacturer
    Agilent Technologies
    Industries
    Environmental, Energy & Chemicals

    Measuring the Optical Properties of Photovoltaic Cells

    Applications
    | 2023 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Determination of an Anionic Fluorochemical Surfactant in a Semiconductor Etch Bath

    Applications
    | 1998 | Thermo Fisher Scientific
    Ion chromatography
    Instrumentation
    Ion chromatography
    Manufacturer
    Thermo Fisher Scientific
    Industries
    Semiconductor Analysis
     

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