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    Determination of Trace Impurities in Electronic Grade Arsine by GC-ICP-QQQ

    Applications
    | 2020 | Agilent Technologies
    GC, ICP/MS, Speciation analysis, ICP/MS/MS
    Instrumentation
    GC, ICP/MS, Speciation analysis, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    PRODUCT QUALITY ASSURANCE SOLUTIONS - SYFT TECHNOLOGIES

    Brochures and specifications
    | 2017 | Syft Technologies
    SIFT-MS
    Instrumentation
    SIFT-MS
    Manufacturer
    Syft Technologies
    Industries
    Materials Testing

    Online monitoring of sulfuric acid and hydrogen peroxide using Raman spectroscopy

    Applications
    | 2023 | Metrohm
    RAMAN Spectroscopy
    Instrumentation
    RAMAN Spectroscopy
    Manufacturer
    Metrohm
    Industries
    Semiconductor Analysis

    SEMICONDUCTOR INDUSTRY SOLUTIONS - SYFT TECHNOLOGIES

    Brochures and specifications
    | 2017 | Syft Technologies
    SIFT-MS
    Instrumentation
    SIFT-MS
    Manufacturer
    Syft Technologies
    Industries
    Semiconductor Analysis

    Measuring Inorganic Impurities in Semiconductor Manufacturing

    Guides
    | 2022 | Agilent Technologies
    GC, ICP/MS, Speciation analysis, ICP/MS/MS
    Instrumentation
    GC, ICP/MS, Speciation analysis, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Agilent Cary 610/620 FTIR microscopes and imaging systems

    Brochures and specifications
    | 2014 | Agilent Technologies
    FTIR Spectroscopy, Microscopy
    Instrumentation
    FTIR Spectroscopy, Microscopy
    Manufacturer
    Agilent Technologies
    Industries

    Spectroelectrochemistry Applications Book

    Guides
    | 2022 | Metrohm
    RAMAN Spectroscopy, NIR Spectroscopy, UV–VIS spectrophotometry, Electrochemistry
    Instrumentation
    RAMAN Spectroscopy, NIR Spectroscopy, UV–VIS spectrophotometry, Electrochemistry
    Manufacturer
    Metrohm
    Industries
    Energy & Chemicals , Materials Testing

    Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

    Applications
    | 2020 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing, Semiconductor Analysis

    Example Analysis Using a Highly Sensitive Trace Moisture Analysis System Measurement of Moisture in Chlorofluorocarbon Gas and High-Purity Nitrogen Gas

    Applications
    | 2018 | Shimadzu
    GC
    Instrumentation
    GC
    Manufacturer
    Shimadzu
    Industries
    Energy & Chemicals

    Instant, Comprehensive, and Sensitive Airborne Molecular Contaminant (AMC) Analysis Using SIFT-MS

    Applications
    | 2017 | Syft Technologies
    SIFT-MS
    Instrumentation
    SIFT-MS
    Manufacturer
    Syft Technologies
    Industries
    Semiconductor Analysis
     

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