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Determination of Trace Impurities in Electronic Grade Arsine by GC-ICP-QQQ
Applications
| 2020 | Agilent Technologies
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
PRODUCT QUALITY ASSURANCE SOLUTIONS - SYFT TECHNOLOGIES
Brochures and specifications
| 2017 | Syft Technologies
SIFT-MS
Instrumentation
SIFT-MS
Manufacturer
Syft Technologies
Industries
Materials Testing
Online monitoring of sulfuric acid and hydrogen peroxide using Raman spectroscopy
Applications
| 2023 | Metrohm
RAMAN Spectroscopy
Instrumentation
RAMAN Spectroscopy
Manufacturer
Metrohm
Industries
Semiconductor Analysis
Analysis of Silanes By Gas Chromatography
Brochures and specifications
| N/A | Wasson-ECE Instrumentation
GC
Instrumentation
GC
Manufacturer
Wasson-ECE Instrumentation
Industries
Energy & Chemicals
Measuring Inorganic Impurities in Semiconductor Manufacturing
Guides
| 2022 | Agilent Technologies
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
SEMICONDUCTOR INDUSTRY SOLUTIONS - SYFT TECHNOLOGIES
Brochures and specifications
| 2017 | Syft Technologies
SIFT-MS
Instrumentation
SIFT-MS
Manufacturer
Syft Technologies
Industries
Semiconductor Analysis
Agilent Cary 610/620 FTIR microscopes and imaging systems
Brochures and specifications
| 2014 | Agilent Technologies
FTIR Spectroscopy, Microscopy
Instrumentation
FTIR Spectroscopy, Microscopy
Manufacturer
Agilent Technologies
Industries
Instant, Comprehensive, and Sensitive Airborne Molecular Contaminant (AMC) Analysis Using SIFT-MS
Applications
| 2017 | Syft Technologies
SIFT-MS
Instrumentation
SIFT-MS
Manufacturer
Syft Technologies
Industries
Semiconductor Analysis
Measuring the optical properties of photovoltaic cells using the Agilent Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500
Applications
| 2011 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike